AT32UC3B0512-A2UT Atmel, AT32UC3B0512-A2UT Datasheet - Page 602
AT32UC3B0512-A2UT
Manufacturer Part Number
AT32UC3B0512-A2UT
Description
IC MCU AVR32 512K FLASH 64TQFP
Manufacturer
Atmel
Series
AVR®32 UC3r
Specifications of AT32UC3B0512-A2UT
Core Processor
AVR
Core Size
32-Bit
Speed
60MHz
Connectivity
I²C, IrDA, SPI, SSC, UART/USART, USB
Peripherals
Brown-out Detect/Reset, DMA, POR, PWM, WDT
Number Of I /o
44
Program Memory Size
512KB (512K x 8)
Program Memory Type
FLASH
Ram Size
96K x 8
Voltage - Supply (vcc/vdd)
1.65 V ~ 1.95 V
Data Converters
A/D 8x10b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
64-TQFP, 64-VQFP
Controller Family/series
AT32UC3B
No. Of I/o's
44
Ram Memory Size
96KB
Cpu Speed
60MHz
No. Of Timers
1
Rohs Compliant
Yes
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
AT32UC3B0512-A2UT
Manufacturer:
MURATA
Quantity:
11 450
Part Number:
AT32UC3B0512-A2UT
Manufacturer:
ATMEL/爱特梅尔
Quantity:
20 000
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27.5.2
27.5.2.1
27.5.2.2
32059K–03/2011
Public JTAG Instructions
IDCODE
SAMPLE_PRELOAD
Table 27-9.
The JTAG standard defines a number of public JTAG instructions. These instructions are
described in the sections below.
This instruction selects the 32 bit Device Identification register (DID) as Data Register. The DID
register consists of a version number, a device number, and the manufacturer code chosen by
JEDEC. This is the default instruction after a JTAG reset. Details about the DID register can be
found in the module configuration section at the end of this chapter.
Starting in Run-Test/Idle, the Device Identification register is accessed in the following way:
Table 27-10. IDCODE Details
This instruction takes a snap-shot of the input/output pins without affecting the system operation,
and pre-loading the scan chain without updating the DR-latch. The boundary-scan chain is
selected as Data Register.
Starting in Run-Test/Idle, the Device Identification register is accessed in the following way:
Instruction
DR Size
DR input value
DR output value
Instructions
IR input value
IR output value
DR Size
DR input value
DR output value
1. Select the IR Scan path.
2. In Capture-IR: The IR output value is latched into the shift register.
3. In Shift-IR: The instruction register is shifted by the TCK input.
4. Return to Run-Test/Idle.
5. Select the DR Scan path.
6. In Capture-DR: The IDCODE value is latched into the shift register.
7. In Shift-DR: The IDCODE scan chain is shifted by the TCK input.
8. Return to Run-Test/Idle.
Instruction Description (Continued)
Description
Shows the number of bits in the data register chain when this instruction is active.
Example: 34 bits
Shows which bit pattern to shift into the data register in the Shift-DR state when this
instruction is active. Multiple such lines may exist, e.g., to distinguish between
reads and writes.
Example: aaaaaaar xxxxxxxx xxxxxxxx xxxxxxxx xx
Shows the bit pattern shifted out of the data register in the Shift-DR state when this
instruction is active. Multiple such lines may exist, e.g., to distinguish between
reads and writes.
Example: xx xxxxxxxx xxxxxxxx xxxxxxxx xxxxxxeb
Details
00001 (0x01)
p0001
32
xxxxxxxx xxxxxxxx xxxxxxxx xxxxxxxx
Device Identification Register
AT32UC3B
602
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