PM5380-BI PMC-Sierra, Inc., PM5380-BI Datasheet - Page 402

• Manufacturer Part Number: PM5380-BI
• Description: Network Interface, SATURN User Network Interface (8x155) Telecom Standard Product
• Manufacturer: PMC-Sierra, Inc.

Proprietary and Confidential to PMC-Sierra, Inc., and for its customers’ internal use.
Document No.: PMC- 2010299, Issue 2
13.13.3
13.13.4
Capture-DR
The capture data register state is used to load parallel data into the test data registers selected by
the current instruction. If the selected register does not allow parallel loads or no loading is
required by the current instruction, the test register maintains its value. Loading occurs on the
rising edge of TCK.
Shift-DR
The shift data register state is used to shift the selected test data registers by one stage. Shifting
is from MSB to LSB and occurs on the rising edge of TCK.
Update-DR
The update data register state is used to load a test register's parallel output latch. In general, the
output latches are used to control the device. For example, for the EXTEST instruction, the
boundary scan test register's parallel output latches are used to control the device's outputs. The
parallel output latches are updated on the falling edge of TCK.
Capture-IR
The capture instruction register state is used to load the instruction register with a fixed
instruction. The load occurs on the rising edge of TCK.
Shift-IR
The shift instruction register state is used to shift both the instruction register and the selected
test data registers by one stage. Shifting is from MSB to LSB and occurs on the rising edge of
TCK.
Update-IR
The update instruction register state is used to load a new instruction into the instruction
register. The new instruction must be scanned in using the Shift-IR state. The load occurs on
the falling edge of TCK.
The Pause-DR and Pause-IR states are provided to allow shifting through the test data and/or
instruction registers to be momentarily paused.
Boundary Scan Instructions
The following is a description of the standard instructions. Each instruction selects a serial test
data register path between input, TDI and output, TDO.
Instructions
BYPASS
The bypass instruction shifts data from input, TDI to output, TDO with one TCK clock period
delay. The instruction is used to bypass the device.
S/UNI®-8x155 ASSP Telecom Standard Product Data Sheet
Released
402