ATEVK1104 Atmel, ATEVK1104 Datasheet - Page 745
![KIT DEV/EVAL FOR AVR32 AT32UC3A](/photos/9/20/92035/atevk1104_sml.jpg)
ATEVK1104
Manufacturer Part Number
ATEVK1104
Description
KIT DEV/EVAL FOR AVR32 AT32UC3A
Manufacturer
Atmel
Series
AVR®32r
Type
MCUr
Datasheets
1.ATAVRONE-PROBECBL.pdf
(16 pages)
2.ATEVK1104.pdf
(826 pages)
3.ATEVK1104.pdf
(90 pages)
4.ATEVK1104.pdf
(6 pages)
5.ATEVK1104.pdf
(12 pages)
Specifications of ATEVK1104
Contents
Evaluation Board, Software and Documentation
Processor To Be Evaluated
AT32UC3A3
Data Bus Width
32 bit
Interface Type
USB, SPI, USART
Silicon Manufacturer
Atmel
Core Architecture
AVR
Core Sub-architecture
AVR UC3
Silicon Core Number
AT32UC3A3256
Silicon Family Name
AVR
Kit Contents
Board CD Docs
Rohs Compliant
Yes
For Use With/related Products
AT32UC3A3
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
ATEVK1104
Manufacturer:
Atmel
Quantity:
135
- ATAVRONE-PROBECBL PDF datasheet
- ATEVK1104 PDF datasheet #2
- ATEVK1104 PDF datasheet #3
- ATEVK1104 PDF datasheet #4
- ATEVK1104 PDF datasheet #5
- Current page: 745 of 826
- Download datasheet (20Mb)
Figure 36-3. Scanning in JTAG instruction
36.6.2.2
36.6.3
32058J–AVR32–04/11
Boundary-Scan
Scanning in/out data
TCK
TAP State
TMS
TDI
TDO
TLR
At the TMS input, apply the sequence 1, 0, 0 at the rising edges of TCK to enter the Shift Data
Register - Shift-DR state. While in this state, upload the selected Data Register (selected by the
present JTAG instruction in the JTAG Instruction Register) from the TDI input at the rising edge
of TCK. In order to remain in the Shift-DR state, the TMS input must be held low. While the Data
Register is shifted in from the TDI pin, the parallel inputs to the Data Register captured in the
Capture-DR state is shifted out on the TDO pin.
Apply the TMS sequence 1, 1, 0 to re-enter the Run-Test/Idle state. If the selected Data Register
has a latched parallel-output, the latching takes place in the Update-DR state. The Exit-DR,
Pause-DR, and Exit2-DR states are only used for navigating the state machine.
As shown in the state diagram, the Run-Test/Idle state need not be entered between selecting
JTAG instruction and using Data Registers.
The Boundary-Scan chain has the capability of driving and observing the logic levels on the dig-
ital I/O pins, as well as the boundary between digital and analog logic for analog circuitry having
off-chip connections. At system level, all ICs having JTAG capabilities are connected serially by
the TDI/TDO signals to form a long shift register. An external controller sets up the devices to
drive values at their output pins, and observe the input values received from other devices. The
controller compares the received data with the expected result. In this way, Boundary-Scan pro-
vides a mechanism for testing interconnections and integrity of components on Printed Circuits
Boards by using the 4 TAP signals only.
The four IEEE 1149.1 defined mandatory JTAG instructions IDCODE, BYPASS, SAMPLE/PRE-
LOAD, and EXTEST can be used for testing the Printed Circuit Board. Initial scanning of the
data register path will show the ID-code of the device, since IDCODE is the default JTAG
instruction. It may be desirable to have the AVR32 device in reset during test mode. If not reset,
inputs to the device may be determined by the scan operations, and the internal software may
be in an undetermined state when exiting the test mode. Entering reset, the outputs of any Port
Pin will instantly enter the high impedance state, making the HIGHZ instruction redundant. If
needed, the BYPASS instruction can be issued to make the shortest possible scan chain
through the device. The device can be set in the reset state either by pulling the external
RESETn pin low, or issuing the AVR_RESET instruction with appropriate setting of the Reset
Data Register.
The EXTEST instruction is used for sampling external pins and loading output pins with data.
The data from the output latch will be driven out on the pins as soon as the EXTEST instruction
is loaded into the JTAG IR-register. Therefore, the SAMPLE/PRELOAD should also be used for
setting initial values to the scan ring, to avoid damaging the board when issuing the EXTEST
RTI
SelDR SelIR CapIR ShIR
Instruction
ImplDefined
Ex1IR UpdIR RTI
AT32UC3A
745
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