MCU ARM 64KB FLASH/TIMER 100LQFP

STM32F101V8T6

Manufacturer Part NumberSTM32F101V8T6
DescriptionMCU ARM 64KB FLASH/TIMER 100LQFP
ManufacturerSTMicroelectronics
SeriesSTM32
STM32F101V8T6 datasheet
 


Specifications of STM32F101V8T6

Core ProcessorARM® Cortex-M3™Core Size32-Bit
Speed36MHzConnectivityI²C, IrDA, LIN, SPI, UART/USART
PeripheralsDMA, PDR, POR, PVD, PWM, Temp Sensor, WDTNumber Of I /o80
Program Memory Size64KB (64K x 8)Program Memory TypeFLASH
Ram Size10K x 8Voltage - Supply (vcc/vdd)2 V ~ 3.6 V
Data ConvertersA/D 16x12bOscillator TypeInternal
Operating Temperature-40°C ~ 85°CPackage / Case100-LQFP
Processor SeriesSTM32F101xCoreARM Cortex M3
Data Bus Width32 bitData Ram Size10 KB
Interface TypeI2C, SPI, USARTMaximum Clock Frequency36 MHz
Number Of Programmable I/os100Number Of Timers3 x 16 bit
Operating Supply Voltage2 V to 3.6 VMaximum Operating Temperature+ 85 C
Mounting StyleSMD/SMT3rd Party Development ToolsEWARM, EWARM-BL, MDK-ARM, RL-ARM, ULINK2
Minimum Operating Temperature- 40 COn-chip Adc12 bit, 16 Channel
For Use With497-10030 - STARTER KIT FOR STM32497-8853 - BOARD DEMO STM32 UNIV USB-UUSCIKSDKSTM32-PL - KIT IAR KICKSTART STM32 CORTEXM3497-8512 - KIT STARTER FOR STM32F10XE MCU497-8505 - KIT STARTER FOR STM32F10XE MCU497-8304 - KIT STM32 MOTOR DRIVER BLDC497-6438 - BOARD EVALUTION FOR STM32 512K497-6289 - KIT PERFORMANCE STICK FOR STM32MCBSTM32UME - BOARD EVAL MCBSTM32 + ULINK-MEMCBSTM32U - BOARD EVAL MCBSTM32 + ULINK2497-6053 - KIT STARTER FOR STM32497-6052 - KIT STARTER FOR STM32497-6050 - KIT STARTER FOR STM32497-6049 - KIT EVALUATION LOW COST STM32497-6048 - BOARD EVALUATION FOR STM32497-6047 - KIT DEVELOPMENT FOR STM32497-5046 - KIT TOOL FOR ST7/UPSD/STR7 MCULead Free Status / RoHS StatusLead free / RoHS Compliant
Eeprom Size-Other names497-6060
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Page 52/87

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Electrical characteristics
Electromagnetic Interference (EMI)
The electromagnetic field emitted by the device is monitored while a simple application is
executed (toggling 2 LEDs through the I/O ports). This emission test is compliant with
IEC61967-2 standard which specifies the test board and the pin loading.
Table 30.
EMI characteristics
Symbol Parameter
S
Peak level
EMI
5.3.11
Absolute maximum ratings (electrical sensitivity)
Based on three different tests (ESD, LU) using specific measurement methods, the device is
stressed in order to determine its performance in terms of electrical sensitivity.
Electrostatic discharge (ESD)
Electrostatic discharges (a positive then a negative pulse separated by 1 second) are
applied to the pins of each sample according to each pin combination. The sample size
depends on the number of supply pins in the device (3 parts × (n+1) supply pins). This test
conforms to the JESD22-A114/C101 standard.
Table 31.
ESD absolute maximum ratings
Symbol
Electrostatic discharge
V
ESD(HBM)
voltage (human body model)
Electrostatic discharge
V
ESD(CDM)
voltage (charge device model)
1. Based on characterization results, not tested in production.
Static latch-up
Two complementary static tests are required on six parts to assess the latch-up
performance:
A supply overvoltage is applied to each power supply pin
A current injection is applied to each input, output and configurable I/O pin
These tests are compliant with EIA/JESD 78 IC latch-up standard.
Table 32.
Electrical sensitivities
Symbol
LU
Static latch-up class
52/87
Conditions
frequency band
0.1 MHz to 30 MHz
= 3.3 V, T
= 25 °C,
V
DD
A
30 MHz to 130 MHz
LQFP100 package
compliant with
130 MHz to 1GHz
IEC 61967-2
SAE EMI Level
Ratings
= +25 °C
T
A
conforming to JESD22-A114
= +25 °C
T
A
conforming to JESD22-C101
Parameter
= +85 °C conforming to JESD78A
T
A
Doc ID 13586 Rev 14
STM32F101x8, STM32F101xB
Max vs. [f
/f
HSE
HCLK
Monitored
8/36 MHz
7
8
13
3.5
Maximum
Conditions
Class
value
2
2000
II
Conditions
]
Unit
dBµV
-
Unit
(1)
V
500
Class
II level A