ST72T511R9T6 STMicroelectronics, ST72T511R9T6 Datasheet - Page 153

Microcontrollers (MCU) UV EPROM 60K SPI/SCI

ST72T511R9T6

Manufacturer Part Number
ST72T511R9T6
Description
Microcontrollers (MCU) UV EPROM 60K SPI/SCI
Manufacturer
STMicroelectronics
Datasheet

Specifications of ST72T511R9T6

Data Bus Width
8 bit
Program Memory Type
EEPROM
Program Memory Size
60 KB
Data Ram Size
2048 B
Interface Type
CAN, SCI, SPI
Maximum Clock Frequency
8 MHz
Number Of Programmable I/os
48
Number Of Timers
5
Operating Supply Voltage
3 V to 5.5 V
Maximum Operating Temperature
+ 85 C
Mounting Style
SMD/SMT
Package / Case
TQFP-64
Minimum Operating Temperature
- 40 C
On-chip Adc
8 bit
Lead Free Status / Rohs Status
No

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0
ADC CHARACTERISTICS (Cont’d)
ADC Accuracy with V
Figure 92. ADC Accuracy Characteristics
Notes:
1. Data based on characterization results over the whole temperature range, monitored in production.
2. ADC Accuracy vs. Negative Injection Current:
For I
for each 10K
under worst-case conditions for injection:
- negative injection
- injection to an Input with analog capability, adjacent to the enabled Analog Input
- at 5V V
Symbol
255
254
253
|E
|E
|E
7
6
5
4
3
2
1
E
E
INJ-
0
V
O
G
D
T
L
SSA
|
|
|
=0.8mA, the typical leakage induced inside the die is 1.6 A and the effect on the ADC accuracy is a loss of 1 LSB
Digital Result ADCDR
DD
1
1LS B
Total unadjusted error
Offset error
Gain Error
Differential linearity error
Integral linearity error
supply, and worst case temperature.
E
O
increase of the external analog source impedance. This effect on the ADC accuracy has been observed
2
I DE AL
3
2)
=
2)
Parameter
4
V
---------------------------------------- -
DD
D D A
=5.0V
5
256
1 LSB
V
2)
E
2)
S SA
6
T
IDEAL
2)
E
7
L
(2)
E
D
f
CPU
253 254 255 256
(3)
=8MHz, f
(1)
ST72311R, ST72511R, ST72512R, ST72532R
Conditions
E
G
ADC
V
DDA
=4MHz
(1) Example of an actual transfer curve
(2) The ideal transfer curve
(3) End point correlation line
E
between the actual and the ideal transfer curves.
E
transition and the first ideal one.
E
transition and the last actual one.
E
between actual steps and the ideal one.
E
between any actual transition and the end point
correlation line.
T
O
G
D
L
1)
=Total Unadjusted Error: maximum deviation
=Integral Linearity Error: maximum deviation
=Offset Error: deviation between the first actual
=Gain Error: deviation between the last ideal
=Differential Linearity Error: maximum deviation
V
in
(LSB
IDEAL
)
Min
-0.5
-1
Max
1.5
0.5
1
1
1
153/164
Unit
LSB

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