SAM9RL64 Atmel Corporation, SAM9RL64 Datasheet - Page 253

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SAM9RL64

Manufacturer Part Number
SAM9RL64
Description
Manufacturer
Atmel Corporation
Datasheets

Specifications of SAM9RL64

Flash (kbytes)
0 Kbytes
Pin Count
217
Max. Operating Frequency
240 MHz
Cpu
ARM926
Hardware Qtouch Acquisition
No
Max I/o Pins
118
Ext Interrupts
118
Usb Transceiver
1
Usb Speed
Hi-Speed
Usb Interface
Device
Spi
1
Twi (i2c)
2
Uart
5
Ssc
2
Sd / Emmc
1
Graphic Lcd
Yes
Video Decoder
No
Camera Interface
No
Adc Channels
6
Adc Resolution (bits)
10
Adc Speed (ksps)
220
Resistive Touch Screen
Yes
Temp. Sensor
No
Crypto Engine
No
Sram (kbytes)
64
Self Program Memory
NO
External Bus Interface
1
Dram Memory
sdram
Nand Interface
Yes
Picopower
No
Temp. Range (deg C)
-40 to 85
I/o Supply Class
1.8/3.3
Operating Voltage (vcc)
1.08 to 1.32
Fpu
No
Mpu / Mmu
No / Yes
Timers
3
Output Compare Channels
3
Input Capture Channels
3
Pwm Channels
4
32khz Rtc
Yes
Calibrated Rc Oscillator
No
C.5.5
ARM DDI 0165B
Scan chains 1 and 2
The scan chain present between DBGSDIN and DBGSDOUT is connected between
DBGTDI and DBGTDO whenever scan chain 3 is selected, or when any unassigned
scan chain number is selected. If there is more than one external scan chain, a
multiplexor must be built externally to apply the desired scan chain output to
DBGSDOUT. The multiplexor can be controlled by decoding DBGSCREG[4:0].
The scan chains allow serial access to the core logic and to the EmbeddedICE hardware
for programming purposes. Each scan chain cell is simple, and comprises a serial
register and a multiplexor. A typical cell is shown in Figure C-4.
Copyright © 2000 ARM Limited. All rights reserved.
CLK
Serial data in
Table C-2 Scan chain number allocation (continued)
enable
Shift
0
1
Scan chain
number
3
4–15
16–31
Figure C-4 Typical scan chain cell
Serial data out
Test mode
Function
External boundary
scan
Reserved
Unassigned
select
0
1
Debug in depth
C-13

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