SAK-TC1766-192F80HL BD Infineon Technologies, SAK-TC1766-192F80HL BD Datasheet - Page 85

• Manufacturer Part Number: SAK-TC1766-192F80HL BD
• Description: IC MCU 32BIT FLASH PG-LQFP-176
• Manufacturer: Infineon Technologies
• Series: TC17xxr

Specifications of SAK-TC1766-192F80HL BD

• Core Processor: TriCore
• Core Size: 32-Bit
• Speed: 80MHz
• Connectivity: ASC, CAN, MLI, MSC, SSC
• Peripherals: DMA, POR, WDT
• Number Of I /o: 81
• Program Memory Size: 1.5MB (1.5M x 8)
• Program Memory Type: FLASH
• Ram Size: 108K x 8
• Voltage - Supply (vcc/vdd): 1.42 V ~ 1.58 V
• Data Converters: A/D 2x10b; A/D 32x8b,10b,12b
• Oscillator Type: External
• Operating Temperature: -40°C ~ 125°C
• Package / Case: 176-LFQFP
• Packages: PG-LQFP-176
• Max Clock Frequency: 80.0 MHz
• Sram (incl. Cache): 108.0 KByte
• Can Nodes: 2
• A / D Input Lines (incl. Fadc): 36
• Program Memory: 1.5 MB
• For Use With: B158-H8539-G2-X-7600IN - KIT STARTER TC176X SERIES
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Eeprom Size: -
• Other names: KT1766192F80HLBDXT; SAK-TC1766-192F80HLBDINTR

Preliminary
Table 4-6
Parameter
ON resistance of
the transmission
gates in the
analog voltage
path
ON resistance for
the ADC test
(pull-down for
AIN7)
Current through
resistance for the
ADC test (pull-
down for AIN7)
1) Voltage overshoot to 4 V are permissible, provided the pulse duration is less than 100 µs and the cumulated
2) Voltage overshoot to 1.7 V are permissible, provided the pulse duration is less than 100 µs and the cumulated
3) A running conversion may become inexact in case of violating the normal operating conditions (voltage
4) If the reference voltage
5) If a reduced reference voltage in a range of
6) Current peaks of up to 6 mA with a duration of max. 2 ns may occur
7) TUE is tested at
8) ADC module capability.
9) Not subject to production test, verified by design / characterization.
10) Value under typical application conditions due to integration (switching noise, etc.).
11) The sum of DNL/INL/Gain/Offset errors does not exceed the related TUE total unadjusted error.
12) For 10-bit conversions the DNL/INL/Gain/Offset error values must be multiplied with factor 0.25.
13) The leakage current definition is a continuous function, as shown in
14) Only one of these parameters is tested, the other is verified by design characterization.
Data Sheet
summary of the pulses does not exceed 1 h.
summary of the pulses does not exceed 1 h.
overshoot).
V
If the reference voltage is reduced with the factor k (k<1), then TUE, DNL, INL Gain and Offset errors increase
with the factor 1/k.
If a reduced reference voltage in a range of 1 V to
ADC speed and accuracy.
For 8-bit conversions the DNL/INL/Gain/Offset error values must be multiplied with 0.0625.
determine the characteristic points of the given continuous linear approximation - they do not define step
function.
DDM
+ 0.07 V), then the accuracy of the ADC decreases by 4LSB12.
ADC Characteristics (cont’d) (Operating Conditions apply)
V
AREF
Symbol
R
R
I
AIN7T
= 3.3 V,
AIN
AIN7T
V
AREF
V
AGND
increases or the
CC –
CC 200
CC –
= 0 V and
Min.
V
DDM
V
/2 to
Limit Values
DDM
81
V
V
DDM
= 3.3 V
V
DDM
Typ.
1
300
15
rms
DDM
/2 is used, then there are additional decrease in the
decreases, so that
is used, then the ADC converter errors increase.
Max.
1.5
1000
30
peak
Figure
4-3. The numerical values defined
Unit Test Conditions /
kΩ
Ω
mA
Electrical Parameters
V
AREF
Remarks
9)
Test feature
available only for
AIN7
9)
Test feature
available only for
AIN7
9)
= (
V
V1.0, 2008-04
DDM
TC1766
+ 0.05 V to