MT48LC32M16A2P-75 L:C TR Micron Technology Inc, MT48LC32M16A2P-75 L:C TR Datasheet - Page 47

• Manufacturer Part Number: MT48LC32M16A2P-75 L:C TR
• Description: IC SDRAM 512MBIT 133MHZ 54TSOP
• Manufacturer: Micron Technology Inc

Specifications of MT48LC32M16A2P-75 L:C TR

• Format - Memory: RAM
• Memory Type: SDRAM
• Memory Size: 512M (32Mx16)
• Speed: 133MHz
• Interface: Parallel
• Voltage - Supply: 3 V ~ 3.6 V
• Operating Temperature: 0°C ~ 70°C
• Package / Case: 54-TSOP II
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

Notes
PDF: 09005aef809bf8f3/Source: 09005aef80818a4a
512MbSDRAM.fm - Rev. L 10/07 EN
10.
11. AC timing and I
12. Other input signals are allowed to transition no more than once every two clocks and
13. I
14. Timing actually specified by
15. Timing actually specified by
16. Timing actually specified by
17. Required clocks are specified by JEDEC functionality and are not dependent on any
18. The I
19. Address transitions average one transition every two clocks.
20. CLK must be toggled a minimum of two times during this period.
21. Based on
1. All voltages referenced to V
2. This parameter is sampled. V
3. I
4. Enables on-chip refresh and address counters.
5. The minimum specifications are used only to indicate cycle time at which proper
6. An initial pause of 100µs is required after power-up, followed by two AUTO REFRESH
7. AC characteristics assume
8. In addition to meeting the transition rate specification, the clock and CKE must tran-
9. Outputs measured at 1.5V with equivalent load:
biased at 1.4V.
with minimum cycle time and the outputs open.
operation over the full temperature range (0°C ≤ T
≤ 85°C for industrial) is ensured.
commands, before proper device operation is ensured. (V
ered up simultaneously. V
REFRESH command wake-ups should be repeated any time the
ment is exceeded.
sit between V
Q
t
a reference to V
High-Z.
crossover point. If the input transition time is longer than 1ns, then the timing is ref-
erenced at V
to Micron technical note TN-48-09.
are otherwise at valid V
cycle rate.
minimum cycle rate.
timing parameter.
frequency is altered for the test condition.
DD
HZ defines the time at which the output achieves the open circuit condition; it is not
DD
is dependent on output loading and cycle rates. Specified values are obtained
specifications are tested after the device is properly initialized.
DD
current will increase or decrease in a proportional amount by the amount the
t
CK = 7.5ns for -75 and -7E.
IL
IH
50pF
(MAX) and V
OH
DD
and V
or V
tests have V
IL
OL
IH
(or between V
. The last valid data element will meet
SS
or V
t
47
SS
T = 1ns.
IH
and V
t
t
t
.
DD
CKS; clock(s) specified as a reference only at minimum
WR plus
WR.
(MIN) and no longer at the 1.5V crossover point. Refer
IL
IL
, V
levels.
= 0V and V
SS
DD
Q must be at same potential.) The two AUTO
Micron Technology, Inc., reserves the right to change products or specifications without notice.
Q = +3.3V; f = 1 MHz, T
IL
t
RP; clock(s) specified as a reference only at
and V
IH
IH
= 3V, with timing referenced to 1.5V
) in a monotonic manner.
A
512Mb: x4, x8, x16 SDRAM
≤ 70°C for commercial; –40°C ≤ T
DD
©2000 Micron Technology, Inc. All rights reserved.
A
and V
= 25°C; pin under test
t
OH before going
t
REF refresh require-
DD
Q must be pow-
Notes
A