mt47h128m16hg-3-it Micron Semiconductor Products, mt47h128m16hg-3-it Datasheet - Page 87

• Manufacturer Part Number: mt47h128m16hg-3-it
• Description: 2gb X4, X8, X16 Ddr2 Sdram
• Manufacturer: Micron Semiconductor Products

Table 26:
PDF: 09005aef824f87b6/Source: 09005aef824f1182
2gb_ddr2.fm - Rev. A 9/06 EN
Parameter
Input setup timing measurement reference level
BA2–BA0, A0–A14 , A0–A13 (x16), CS#, RAS#, CAS#, WE#,
ODT, DM, UDM, LDM, and CKE
Input hold timing measurement reference level
BA2–BA0, A0–A14 , A0–A13 (x16), CS#, RAS#, CAS#, WE#,
ODT, DM, UDM, LDM, and CKE
Input timing measurement reference level (single-ended)
DQS for x4, x8; UDQS, LDQS for x16
Input timing measurement reference level (differential)
CK, CK# for x4, x8, x16
DQS, DQS# for x4, x8; RDQS, RDQS# for x8
UDQS, UDQS#, LDQS, LDQS# for x16
AC Input Test Conditions
Notes:
1. All voltages referenced to V
2. Input waveform setup timing (
3. Input waveform hold (
4. Input waveform setup timing (
5. Input waveform setup timing (
6. Input waveform timing is referenced to the crossing point level (V
7. See “Input Slew Rate Derating” on page 88.
8. The slew rate for single-ended inputs is measured from DC-level to AC-level, V
9. The slew rate for differentially ended inputs is measured from twice the DC-level to twice
V
test, as shown in Figure 77 on page 102.
level for a rising signal and V
shown in Figure 77 on page 102.
referenced from the crossing of DQS, UDQS, or LDQS through the V
device under test, as shown in Figure 79 on page 103.
enabled is referenced from the cross-point of DQS/DQS#, UDQS/UDQS#, or LDQS/LDQS#, as
shown in Figure 78 on page 102.
(V
is the complementary input signal, as shown in Figure 80 on page 103.
V
to V
Figures 70, 72, 74, and 76.
the AC-level: 2 x V
falling edge). For example, the CK/CK# would be –250mV to +500mV for CK rising edge and
would be +250mV to –500mV for CK falling edge.
IH
IH
TR
(
(
AC
AC
REF
and V
) level for a rising signal and V
) on the rising edge and V
, the valid intersection is where the “tangent” line intersects V
CP
Input Electrical Characteristics and Operating Conditions
) applied to the device under test, where V
IL
(
DC
t
) to 2 x V
IH
b
) timing is referenced from the input signal crossing at the V
SS
87
IH
.
t
(
t
t
IS
DS) and hold timing (
DS) and hold timing (
IH
Symbol
DC
Vref(dc)
IL
b
(
(
V
V
) for a falling signal applied to the device under test, as
AC
V
) is referenced from the input signal crossing at the
AC
RH
RD
RS
) on the rising edge and 2 x V
IL
) to V
(
AC
Micron Technology, Inc., reserves the right to change products or specifications without notice.
) for a falling signal applied to the device under
IH
(
V
DC
DD
) on the falling edge. For signals referenced
2Gb: x4, x8, x16 DDR2 SDRAM
Min
Q x 0.49
See Note 2
See Note 3
t
t
DH) for single-ended data strobe is
DH) when differential data strobe is
V
IX
TR
(
AC
is the “true” input signal and V
V
DD
)
Max
Q x 0.51
©2006 Micron Technology, Inc. All rights reserved.
IL
IX
(
AC
REF
) of two input signals
REF
) to 2 x V
level applied to the
, as shown in
Units
V
V
IL
IH
(
(
DC
DC
1, 2, 7, 8
1, 3, 7, 8
1, 4, 7, 8
) to
1, 5, 6,
) on the
Notes
7, 9
IL
(
DC
CP
)