S9S12P32J0VFTR Freescale Semiconductor, S9S12P32J0VFTR Datasheet - Page 523

• Manufacturer Part Number: S9S12P32J0VFTR
• Description: 16-bit Microcontrollers - MCU 16 BIT 32K FLASH
• Manufacturer: Freescale Semiconductor

Specifications of S9S12P32J0VFTR

• Rohs: yes
• Core: S12
• Processor Series: MC9S12P
• Data Bus Width: 16 bit
• Maximum Clock Frequency: 16 MHz
• Program Memory Size: 32 KB
• Data Ram Size: 2 KB
• On-chip Adc: Yes
• Operating Supply Voltage: 3.15 V to 5.5 V
• Operating Temperature Range: - 40 C to + 105 C
• Package / Case: QFN-48
• Mounting Style: SMD/SMT

A.4
A.4.1
With each transition of the feedback clock, the deviation from the reference clock is measured and input
voltage to the VCO is adjusted accordingly.The adjustment is done continuously with no abrupt changes
in the VCOCLK frequency. Noise, voltage, temperature and other factors cause slight variations in the
control loop resulting in a clock jitter. This jitter affects the real minimum and maximum clock periods as
illustrated in
Freescale Semiconductor
1. T
2. Typical data retention values are based on intrinsic capability of the technology measured at high temperature and de-rated
3. Spec table quotes typical endurance evaluated at 25°C for this product family. For additional information on how Freescale
Conditions are shown in
Num C
application.
to 25°C using the Arrhenius equation. For additional information on how Freescale defines Typical Data Retention, please
refer to Engineering Bulletin EB618
defines Typical Endurance, please refer to Engineering Bulletin EB619.
1
2
3
4
5
6
Javg
does not exceed 85°C in a typical temperature profile over the lifetime of a consumer, industrial or automotive
C Data retention at an average junction temperature of T
C Program Flash number of program/erase cycles
C Data retention at an average junction temperature of T
C Data retention at an average junction temperature of T
C Data retention at an average junction temperature of T
C Data Flash number of program/erase cycles (-40°C ≤ tj ≤ 150°C)
Phase Locked Loop
85°C
(-40°C ≤ tj ≤ 150°C)
85°C
85°C
85°C
Jitter Definitions
Figure
(1)
1
1
1
All values shown in
characterization.
after up to 50,000 program/erase cycles
after up to 10,000 program/erase cycles
after less than 100 program/erase cycles
after up to 10,000 program/erase cycles
A-2.
Table A-4
unless otherwise noted
Table A-19. NVM Reliability Characteristics
Rating
S12P-Family Reference Manual, Rev. 1.13
Table A-19
Program Flash Arrays
Data Flash Array
are preliminary and subject to further
NOTE
Javg
Javg
Javg
Javg
=
=
=
=
Symbol
t
t
t
t
NVMRET
NVMRET
NVMRET
NVMRET
n
n
FLPE
FLPE
10K
50K
Min
20
10
20
5
100K
500K
100
100
100
100
Typ
Electrical Characteristics
(2)
2
2
2
(3)
3
Max
—
—
—
—
—
—
Cycles
Cycles
Years
Years
Years
Years
Unit
523