C8051F120-GQR Silicon Laboratories Inc, C8051F120-GQR Datasheet - Page 38

• Manufacturer Part Number: C8051F120-GQR
• Description: IC 8051 MCU FLASH 128K 100TQFP
• Manufacturer: Silicon Laboratories Inc
• Series: C8051F12xr

Specifications of C8051F120-GQR

• Core Processor: 8051
• Core Size: 8-Bit
• Speed: 100MHz
• Connectivity: EBI/EMI, SMBus (2-Wire/I²C), SPI, UART/USART
• Peripherals: Brown-out Detect/Reset, POR, PWM, Temp Sensor, WDT
• Number Of I /o: 64
• Program Memory Size: 128KB (128K x 8)
• Program Memory Type: FLASH
• Ram Size: 8.25K x 8
• Voltage - Supply (vcc/vdd): 3 V ~ 3.6 V
• Data Converters: A/D 8x8b, 8x12b; D/A 2x12b
• Oscillator Type: Internal
• Operating Temperature: -40°C ~ 85°C
• Package / Case: 100-TQFP, 100-VQFP
• Processor Series: C8051F1x
• Core: 8051
• Data Bus Width: 8 bit
• Data Ram Size: 8.25 KB
• Interface Type: I2C, SMBus, SPI, UART
• Maximum Clock Frequency: 100 MHz
• Number Of Programmable I/os: 64
• Number Of Timers: 5
• Operating Supply Voltage: 2.7 V to 3.6 V
• Maximum Operating Temperature: + 85 C
• Mounting Style: SMD/SMT
• 3rd Party Development Tools: PK51, CA51, A51, ULINK2
• Development Tools By Supplier: C8051F120DK
• Minimum Operating Temperature: - 40 C
• On-chip Adc: 12 bit, 8 Channel
• On-chip Dac: 12 bit, 2 Channel
• For Use With: 336-1285 - KIT DEV EMBEDDED MODEM336-1284 - KIT DEV EMBEDDED ETHERNET336-1224 - DEVKIT-F120/21/22/23/24/25/26/27
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Eeprom Size: -
• Lead Free Status / Rohs Status: Details

C8051F120/1/2/3/4/5/6/7
C8051F130/1/2/3
2.
38
Ambient temperature under bias
Storage Temperature
Voltage on any Pin (except V
Respect to DGND
Voltage on any Port I/O Pin or RST with Respect to
DGND
Voltage on V
Maximum Total Current through V
and AGND
Maximum Output Current Sunk by any Port pin
Maximum Output Current Sunk by any other I/O pin
Maximum Output Current Sourced by any Port pin
Maximum Output Current Sourced by any other I/O
Pin
*Note: Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device.
Absolute Maximum Ratings
This is a stress rating only and functional operation of the devices at those or any other conditions above those
indicated in the operation listings of this specification is not implied. Exposure to maximum rating conditions for
extended periods may affect device reliability.
DD
with Respect to DGND
Parameter
Table 2.1. Absolute Maximum Ratings
DD
and Port I/O) with
DD
, AV+, DGND,
Rev. 1.4
Conditions
–0.3
–0.3
–0.3
Min
–55
–65
—
—
—
—
—
*
Typ
—
—
—
—
—
—
—
—
—
—
V
Max
125
150
800
100
100
DD
0.3
5.8
4.2
50
50
+
Units
mA
mA
mA
mA
mA
°C
°C
V
V
V