PEB3265 Infineon Technologies Corporation, PEB3265 Datasheet - Page 107

• Manufacturer Part Number: PEB3265
• Description: (PEB326x / PEB426x) Dual Channel Slicofi-2 / Slic Duslic
• Manufacturer: Infineon Technologies Corporation

Preliminary
4.8
4.8.1
Subscriber loops are affected by a variety of failures which have to be monitored.
Monitoring the loop supposes the access to the subscriber loop and to have test
equipment in place which are capable to perform certain measurements. The
measurements or tests involve resistance, capacitance, leakage, and measurements of
interfering currents and voltages.
4.8.1.1
Conventional linecards in Central Office (CO) applications usually need two test relays
per channel to access the subscriber loop with the appropriate test equipment. One relay
(test-out) connects the actual test unit to the local loop. All required line tests can be
accomplished that way. The second relay (test-in) separates the local loop from the
SLIC-E/-E2/-P and connects a termination impedance to it. Hence, by sending a tone
signal the entire loop can be checked, including the SLICOFI-2 and SLIC-E/-E2/-P.
4.8.1.2
The DuSLIC with its Integrated Test and Diagnosis Functions (ITDF) is capable to
perform all tests necessary to monitor the local loop without an external test unit and test
relays. The fact, that measurements can be accomplished much faster as with
conventional test capabilities makes it even more a compelling argument for the DuSLIC.
With the DuSLIC both channels are able to perform line tests concurrently, which also
has a tremendous impact on the test time. All in all, the DuSLIC increases the quality of
service and reduces the costs in various applications.
1)
Data Sheet
only available with DuSLIC-E/-E2/-P
Integrated Test and Diagnosis Functions (ITDF)
Introduction
Conventional Line Testing
DuSLIC Line Testing
107
Operational Description
1)
2000-07-14
DuSLIC