AT91SAM7S128C-MU Atmel, AT91SAM7S128C-MU Datasheet - Page 553

• Manufacturer Part Number: AT91SAM7S128C-MU
• Description: IC MCU ARM7 128K FLASH 64-QFN
• Manufacturer: Atmel
• Series: AT91SAMr

Specifications of AT91SAM7S128C-MU

• Core Processor: ARM7
• Core Size: 16/32-Bit
• Speed: 55MHz
• Connectivity: I²C, SPI, SSC, UART/USART, USB
• Peripherals: Brown-out Detect/Reset, DMA, POR, PWM, WDT
• Number Of I /o: 32
• Program Memory Size: 128KB (128K x 8)
• Program Memory Type: FLASH
• Ram Size: 32K x 8
• Voltage - Supply (vcc/vdd): 1.65 V ~ 1.95 V
• Data Converters: A/D 8x10b
• Oscillator Type: Internal
• Operating Temperature: -40°C ~ 85°C
• Package / Case: 64-VQFN Exposed Pad, 64-HVQFN, 64-SQFN, 64-DHVQFN
• Core: ARM7TDMI
• For Use With: AT91SAM-ICE - EMULATOR FOR AT91 ARM7/ARM9AT91SAM7S-EK - KIT EVAL FOR ARM AT91SAM7S
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Eeprom Size: -
• Lead Free Status / Rohs Status: Details
• Other names: AT91SAM7S128-MU; AT91SAM7S128-MU

37. AT91SAM7S Electrical Characteristics
37.1
Table 37-1.
6175K–ATARM–30-Aug-10
Operating Temperature (Industrial) ...... ..........-40° C to + 85° C
Storage Temperature ..... ...............................-60°C to + 150°C
Voltage on Input Pins
with Respect to Ground ..... ..............................-0.3V to + 5.5V
Maximum Operating Voltage
(VDDCORE, and VDDPLL)................. ..............................2.0V
Maximum Operating Voltage
(VDDIO, VDDIN and VDDFLASH)........................................4.0V
Total DC Output Current on all I/O lines
48-lead LQFP/QFN package...........................................100 mA
64-lead LQFP/QFN package...........................................150 mA
Absolute Maximum Ratings
Absolute Maximum Ratings*
AT91SAM7S Series Preliminary
*NOTICE:
Stresses beyond those listed under “Absolute Maxi-
mum Ratings” may cause permanent damage to
the device. This is a stress rating only and func-
tional operation of the device at these or other con-
ditions beyond those indicated in the operational
sections of this specification is not implied. Expo-
sure to absolute maximum rating conditions for
extended periods may affect device reliability.
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