EP3SL150F1152C2N Altera, EP3SL150F1152C2N Datasheet - Page 232
![IC STRATX III FPGA 150K 1152FBGA](/photos/6/72/67293/544-1152-fbga_sml.jpg)
EP3SL150F1152C2N
Manufacturer Part Number
EP3SL150F1152C2N
Description
IC STRATX III FPGA 150K 1152FBGA
Manufacturer
Altera
Series
Stratix® IIIr
Datasheets
1.EP3SL150F780C4N.pdf
(16 pages)
2.EP3SL150F780C4N.pdf
(332 pages)
3.EP3SL150F780C4N.pdf
(456 pages)
Specifications of EP3SL150F1152C2N
Number Of Logic Elements/cells
142500
Number Of Labs/clbs
5700
Total Ram Bits
6390
Number Of I /o
744
Voltage - Supply
0.86 V ~ 1.15 V
Mounting Type
Surface Mount
Operating Temperature
0°C ~ 85°C
Package / Case
1152-FBGA
For Use With
544-2568 - KIT DEVELOPMENT STRATIX III
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Number Of Gates
-
Other names
544-2409
EP3SL150F1152C2NES
EP3SL150F1152C2NES
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Part Number:
EP3SL150F1152C2N
Manufacturer:
ALTERA
Quantity:
20 000
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7–28
Figure 7–14. OCT Calibration Block (CB) Location in EP3SL110, EP3SL150, EP3SE80, and EP3SE110 Devices
Note to
(1)
Figure 7–15. OCT Calibration Block (CB) Location in EP3SL200, EP3SE260 and EP3SL340
Note to
(1)
Stratix III Device Handbook, Volume 1
Figure 7–14
Figure 7–15
Figure
Figure
CB 1
CB 0
7–14:
7–15:
CB 0
CB 1
is a top view of the silicon die that corresponds to a reverse view for flip chip packages. It is a graphical representation only.
is a top view of the silicon die that corresponds to a reverse view for flip chip packages. It is a graphical representation only.
Bank 2A
Bank 1A
Bank 1C
Bank 2C
Bank 1B
Bank 1C
Bank 2C
Bank 2B
Bank 1A
Bank 2A
EP3SL110
EP3SL150
EP3SE80
EP3SE110
EP3SL200
EP3SE260
EP3SL340
Bank 6B
Bank 6C
Bank 5C
Bank 5B
Bank 5A
Bank 6A
Bank 6A
Bank 6C
Bank 5C
Bank 5A
CB 5
CB 6
CB 6
CB 5
Chapter 7: Stratix III Device I/O Features
(Note 1)
I/O bank with OCT
calibration block
I/O bank without OCT
calibration block
© July 2010 Altera Corporation
I/O bank with OCT
calibration block
I/O bank without OCT
calibration block
OCT Calibration
(Note 1)
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