ADUC7033BCPZ-8L Analog Devices Inc, ADUC7033BCPZ-8L Datasheet - Page 20

• Manufacturer Part Number: ADUC7033BCPZ-8L
• Description: IC MCU FLASH 96K ANLG I/O 48LFCS
• Manufacturer: Analog Devices Inc
• Type: Battery Managementr

Specifications of ADUC7033BCPZ-8L

• Input Type: Logic
• Output Type: Logic
• Interface: UART, SPI
• Current - Supply: 20mA
• Mounting Type: Surface Mount
• Package / Case: 48-LFCSP
• For Use With: EVAL-ADUC7033QSPZ - EVAL DEV QUICK START ADUC7033
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

ADuC7033
TERMINOLOGY
Conversion Rate
The conversion rate specifies the rate at which an output result
is available from the ADC, after the ADC settles.
The sigma-delta (Σ-Δ) conversion techniques used on this part
mean that while the ADC front-end signal is oversampled at a
relatively high sample rate, a subsequent digital filter is used to
decimate the output giving a valid 16-bit data conversion result
at output rates from 1 Hz to 8 kHz.
Note that when software switches from one input to another on
the same ADC, the digital filter must first be cleared and then
allowed to average a new result. Depending on the con-
figuration of the ADC and the type of filter, this may require
multiple conversion cycles.
Integral Nonlinearity (INL)
INL is the maximum deviation of any code from a straight line
passing through the endpoints of the transfer function. The end-
points of the transfer function are zero scale, a point ½ LSB
below the first code transition, and full scale, a point ½ LSB
above the last code transition (111 . . . 110 to 111 . . . 111).
The error is expressed as a percentage of full scale.
No Missing Codes
No missing codes is a measure of the differential nonlinearity
of the ADC. The error is expressed in bits and specifies the
number of codes (ADC results) as 2
missing codes, guaranteed to occur through the full ADC
input range.
Offset Error
Offset error is the deviation of the first code transition ADC
input voltage from the ideal first code transition.
Offset Error Drift
Offset error drift is the variation in absolute offset error with
respect to temperature. This error is expressed as LSBs per °C.
Gain Error
Gain error is a measure of the span error of the ADC. It is a
measure of the difference between the measured and the ideal
span between any two points in the transfer function.
N
bits, where N = no
Rev. B | Page 20 of 140
Output Noise
The output noise is specified as the standard deviation (or 1 × Σ)
of ADC output codes distribution collected when the ADC
input voltage is at a dc voltage. It is expressed as μ rms. The
output, or rms noise, can be used to calculate the effective
resolution of the ADC as defined by the following equation:
where Effective Resolution is expressed in bits.
The peak-to-peak noise is defined as the deviation of codes that
fall within 6.6 × Σ of the distribution of ADC output codes
collected when the ADC input voltage is at dc. The peak-to-
peak noise is therefore calculated as 6.6 × the rms noise.
The peak-to-peak noise can be used to calculate the ADC
(noise-free code) resolution for which there is no code flicker
within a 6.6-Σ limit as defined by the following equation:
where Noise-Free Code Resolution is expressed in bits.
Data Sheet Acronyms
ADC
ARM
JTAG
LIN
LSB
LVF
MCU
MMR
MSB
OTP
PID
POR
PSM
rms
STI
Effective Resolution = log
Noise-Free Code Resolution = log
to-Peak Noise)
analog-to-digital converter
advanced RISC machine
joint test action group
local interconnect network
least significant byte/bit
low voltage flag
microcontroller
memory mapped register
most significant byte/bit
one time programmable
protected identifier
power-on reset
power supply monitor
root mean square
serial test interface
2
(Full-Scale Range/rms Noise)
2
(Full-Scale Range/Peak-