DSPD56367PV150 Freescale Semiconductor, DSPD56367PV150 Datasheet - Page 23

• Manufacturer Part Number: DSPD56367PV150
• Manufacturer: Freescale Semiconductor

Specifications of DSPD56367PV150

• Device Core Size: 24b
• Format: Fixed Point
• Clock Freq (max): 150MHz
• Mips: 150
• Device Input Clock Speed: 150MHz
• Ram Size: 69KB
• Program Memory Size: 120KB
• Operating Supply Voltage (typ): 1.8/3.3V
• Operating Supply Voltage (min): 1.71/3.14V
• Operating Supply Voltage (max): 1.89/3.46V
• Operating Temp Range: -40C to 95C
• Operating Temperature Classification: Industrial
• Mounting: Surface Mount
• Pin Count: 144
• Package Type: LQFP
• Lead Free Status / Rohs Status: Not Compliant

2.16
Freescale Semiconductor
Signal
Name
TDO
TMS
TCK
TDI
JTAG/OnCE Interface
Signal Type
Output
Input
Input
Input
State during
Tri-Stated
Reset
Input
Input
Input
Table 2-15 JTAG/OnCE Interface
DSP56367 Technical Data, Rev. 2.1
Test Clock—TCK is a test clock input signal used to synchronize the JTAG test
logic. It has an internal pull-up resistor.
This input is 3.3V tolerant.
Test Data Input—TDI is a test data serial input signal used for test instructions
and data. TDI is sampled on the rising edge of TCK and has an internal pull-up
resistor.
This input is 3.3V tolerant.
Test Data Output—TDO is a test data serial output signal used for test
instructions and data. TDO is tri-statable and is actively driven in the shift-IR
and shift-DR controller states. TDO changes on the falling edge of TCK.
Test Mode Select—TMS is an input signal used to sequence the test
controller’s state machine. TMS is sampled on the rising edge of TCK and has
an internal pull-up resistor.
This input is 3.3V tolerant.
Signal Description
JTAG/OnCE Interface
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