ST7232AK2-Auto STMicroelectronics, ST7232AK2-Auto Datasheet - Page 165

• Manufacturer Part Number: ST7232AK2-Auto
• Description: 8-bit MCU for automotive, 16 Kbyte Flash, 10-bit ADC, 4 timers, SPI, SCI
• Manufacturer: STMicroelectronics

Specifications of ST7232AK2-Auto

• Hdflash Endurance: 100 cycles, data retention
• Clock Sources: crystal/ceramic resonator oscillators and bypass for external clock
• Four Power Saving Modes: halt, active halt, wait and slow
• Main Clock Controller With: real time base, beep and clock-out capabilities
• Two 16-bit Timers With: 2 input captures, 2 output compares, PWM and pulse generator modes

ST7232Axx-Auto
12.7
12.7.1
Electromagnetic compatability (EMC) characteristics
Susceptibility tests are performed on a sample basis during product characterization.
Functional electromagnetic susceptibility (EMS)
Based on a simple running application on the product (toggling 2 LEDs through I/O ports),
the product is stressed by two electro magnetic events until a failure occurs (indicated by the
LEDs).
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A device reset allows normal operations to be resumed. The test results are given in the
table below based on the EMS levels and classes defined in application note AN1709.
Designing hardened software to avoid noise problems
EMC characterization and optimization are performed at component level with a typical
application environment and simplified MCU software. It should be noted that good EMC
performance is highly dependent on the user application and the software in particular.
Therefore it is recommended that the user applies EMC software optimization and
prequalification tests in relation with the EMC level requested for his application.
Software recommendations
The software flowchart must include the management of runaway conditions such as:
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Prequalification trials
Most of the common failures (unexpected reset and program counter corruption) can be
reproduced by manually forcing a low state on the RESET pin or the oscillator pins for 1
second.
To complete these trials, ESD stress can be applied directly on the device, over the range of
specification values. When unexpected behaviour is detected, the software can be
hardened to prevent unrecoverable errors occurring (see application note AN1015).
ESD: Electrostatic discharge (positive and negative) is applied on all pins of the device
until a functional disturbance occurs. This test conforms with the
IEC 1000 - 4 - 2 standard.
FTB: A burst of fast transient voltage (positive and negative) is applied to V
through a 100pF capacitor, until a functional disturbance occurs. This test conforms
with the IEC 1000 - 4 - 4 standard.
Corrupted program counter
Unexpected reset
Critical data corruption (control registers...)
Electrical characteristics
DD
and V
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