IDT82V2108PXG IDT, Integrated Device Technology Inc, IDT82V2108PXG Datasheet - Page 113

• Manufacturer Part Number: IDT82V2108PXG
• Description: IC FRAMER T1/J1/E1 8CH 128-PQFP
• Manufacturer: IDT, Integrated Device Technology Inc

Specifications of IDT82V2108PXG

• Controller Type: T1/E1/J1 Framer
• Interface: Parallel
• Voltage - Supply: 2.97 V ~ 3.63 V
• Current - Supply: 160mA
• Operating Temperature: -40°C ~ 85°C
• Mounting Type: Surface Mount
• Package / Case: 128-MQFP, 128-PQFP
• Screening Level: Industrial
• Mounting: Surface Mount
• Operating Temperature (min): -40C
• Operating Temperature (max): 85C
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Other names: 82V2108PXG

IDT82V2108
4.1.3.3
generate and detect an enormous variety of pseudo-random and repeti-
Operation
Table 45: Test Pattern in E1 Mode
Note:
1. TR - Tap Register. 2. LR - Shift Register Length Register. 3. IR#1 - PRGD Pattern Insertion #1 Register. 4. IR#2 - PRGD Pattern Insertion #2 Register. 5. IR#3 - PRGD Pattern
Insertion #3 Register. 6. IR#4 - PRGD Pattern Insertion #4 Register. 7. TINV, RINV - contained in the PRGD Control register.
DS1 Inband Loopback deactivate
2
2
DS1 Inband Loopback activate
7
Double alternating ones/zeros
7
- 1 (Fractional T1 LB Activate)
- 1(Fractional T1 LB Activate)
The IDT82V2108 provides one PRBS generator/detector block to
Alternating ones/zeros
2
11
2
2
2
- 1 (O.152, O.153)
2
Pattern Type
Pattern Type
15
20
23
9
All zeros
- 1 (O.153)
All ones
- 1 (O.151)
- 1 (O.153)
- 1 (O.151)
2
2
2
2
2
2
2
2
2
3 in 24
1 in 16
2
2
2
2
2
1 in 8
1 in 4
Using PRBS Generator / Detector
10
17
18
21
22
25
28
29
31
3
4
5
6
7
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
TR
TR
0D
00
00
01
04
00
03
03
04
02
08
02
06
02
01
00
02
02
01
02
00
00
00
00
00
00
00
00
00
00
11
1
1
Pseudo-Random Pattern Generation (the PS[b4, E1-070H] is logic 0)
Repetitive Pattern Generation (the PS [b4, E1-070H] is logic 1)
LR
LR
0A
0E
1B
1C
1E
0F
02
03
04
05
06
06
06
08
09
10
11
13
14
15
16
18
00
00
01
03
17
07
03
04
02
2
2
IR#1
IR#1
FF
FF
FF
FF
FF
FF
FF
FF
FF
FF
FF
FF
FF
FF
FF
FF
FF
FF
FF
FF
FF
FF
FE
FE
FC
FC
22
01
01
F1
F0
3
3
103
tive patterns to diagnose E1 data stream of all eight framers. The com-
mon test patterns are shown in tabular form in Table 45.
IR#2
IR#2
FF
FF
FF
FF
FF
FF
FF
FF
FF
FF
FF
FF
FF
FF
FF
FF
FF
FF
FF
FF
FF
FF
FF
FF
FF
00
00
FF
FF
FF
FF
4
4
IR#3
IR#3
FF
FF
FF
FF
FF
FF
FF
FF
FF
FF
FF
FF
FF
FF
FF
FF
FF
FF
FF
FF
FF
FF
FF
FF
FF
FF
FF
FF
FF
FF
20
5
5
IR#4
IR#4
FF
FF
FF
FF
FF
FF
FF
FF
FF
FF
FF
FF
FF
FF
FF
FF
FF
FF
FF
FF
FF
FF
FF
FF
FF
FF
FF
FF
FF
FF
0F
6
6
T1 / E1 / J1 OCTAL FRAMER
TINV
TINV
0
0
0
0
0
0
1
0
0
0
1
0
0
0
0
0
1
0
0
0
0
0
0
0
0
0
0
0
0
0
0
7
7
March 5, 2009
RINV
RINV
0
0
0
0
0
0
1
0
0
0
1
0
0
0
0
0
1
0
0
0
0
0
0
0
0
0
0
0
0
0
0
7
7