EP4SGX530HH35C2N Altera, EP4SGX530HH35C2N Datasheet - Page 412
![IC STRATIX IV FPGA 530K 1152HBGA](/photos/37/12/371227/1152pin_fbga_sml.jpg)
EP4SGX530HH35C2N
Manufacturer Part Number
EP4SGX530HH35C2N
Description
IC STRATIX IV FPGA 530K 1152HBGA
Manufacturer
Altera
Series
Stratix® IV GXr
Datasheets
1.EP4SGX110DF29C3N.pdf
(80 pages)
2.EP4SGX110DF29C3N.pdf
(1154 pages)
3.EP4SGX110DF29C3N.pdf
(432 pages)
4.EP4SGX110DF29C3N.pdf
(22 pages)
5.EP4SGX110DF29C3N.pdf
(30 pages)
6.EP4SGX110DF29C3N.pdf
(72 pages)
7.EP4SGX530HH35C2N.pdf
(1145 pages)
Specifications of EP4SGX530HH35C2N
Number Of Logic Elements/cells
531200
Number Of Labs/clbs
21248
Total Ram Bits
27376
Number Of I /o
564
Voltage - Supply
0.87 V ~ 0.93 V
Mounting Type
Surface Mount
Operating Temperature
0°C ~ 85°C
Package / Case
1152-HBGA
Family Name
Stratix® IV
Number Of Logic Blocks/elements
531200
# Registers
424960
# I/os (max)
560
Process Technology
40nm
Operating Supply Voltage (typ)
900mV
Logic Cells
531200
Ram Bits
28033024
Operating Supply Voltage (min)
0.87V
Operating Supply Voltage (max)
0.93V
Operating Temp Range
0C to 85C
Operating Temperature Classification
Commercial
Mounting
Surface Mount
Pin Count
1152
Package Type
FCHBGA
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Number Of Gates
-
Lead Free Status / Rohs Status
Compliant
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
- EP4SGX110DF29C3N PDF datasheet
- EP4SGX110DF29C3N PDF datasheet #2
- EP4SGX110DF29C3N PDF datasheet #3
- EP4SGX110DF29C3N PDF datasheet #4
- EP4SGX110DF29C3N PDF datasheet #5
- EP4SGX110DF29C3N PDF datasheet #6
- EP4SGX530HH35C2N PDF datasheet #7
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11–6
Error Detection Block
Stratix IV Device Handbook Volume 1
1
You can enable the Stratix IV device error detection block in the Quartus II software
(refer to
calculate the 16-bit CRC signature for the configuration CRAM bits in the device.
The CRC circuit continues running even if an error occurs. When a soft error occurs,
the device sets the CRC_ERROR pin high. Two types of CRC detection checks the
configuration bits:
■
■
The
in user mode.
CRAM error checking ability (16-bit CRC), which occurs during user mode to be
used by the CRC_ERROR pin.
■
■
■
■
■
16-bit CRC that is embedded in every configuration data frame.
■
■
“Error Detection Block”
For each frame of data, the pre-calculated 16-bit CRC enters the CRC circuit at
the end of the frame data and determines whether there is an error or not.
If an error occurs, the search engine starts to find the location of the error.
The error messages are shifted out through the JTAG instruction or core
interface logics while the error detection block continues running.
The JTAG interface reads out the 16-bit CRC result for the first frame and also
shifts the 16-bit CRC bits to the 16-bit CRC storage registers for test purposes.
Single error, double errors, or double-errors adjacent to each other are
deliberately introduced to configuration memory for testing and design
verification.
During configuration, after a frame of data is loaded into the Stratix IV device,
the pre-computed CRC is shifted into the CRC circuitry.
At the same time, the CRC value for the data frame shifted-in is calculated. If
the pre-computed CRC and calculated CRC values do not match, nSTATUS is set
low. Every data frame has a 16-bit CRC; therefore, there are many 16-bit CRC
values for the whole configuration bitstream. Every device has different
lengths of configuration data frame.
“Software Support” on page
section describes the 16-bit CRC only when the device is
11–10). This block contains the logic necessary to
Chapter 11: SEU Mitigation in Stratix IV Devices
February 2011 Altera Corporation
Error Detection Block
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