MCHC908MR8VFAE Freescale Semiconductor, MCHC908MR8VFAE Datasheet - Page 135

IC MCU 8K FLASH 8MHZ PWM 32-LQFP

MCHC908MR8VFAE

Manufacturer Part Number
MCHC908MR8VFAE
Description
IC MCU 8K FLASH 8MHZ PWM 32-LQFP
Manufacturer
Freescale Semiconductor
Series
HC08r
Datasheet

Specifications of MCHC908MR8VFAE

Core Processor
HC08
Core Size
8-Bit
Speed
8MHz
Connectivity
SCI
Peripherals
LVD, POR, PWM
Number Of I /o
16
Program Memory Size
8KB (8K x 8)
Program Memory Type
FLASH
Ram Size
256 x 8
Voltage - Supply (vcc/vdd)
4.5 V ~ 5.5 V
Data Converters
A/D 7x10b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 105°C
Package / Case
32-LQFP
Processor Series
HC08MR
Core
HC08
Data Bus Width
8 bit
Data Ram Size
512 B
Interface Type
SCI, SPI
Maximum Clock Frequency
8 MHz
Number Of Programmable I/os
33
Number Of Timers
4
Maximum Operating Temperature
+ 105 C
Mounting Style
SMD/SMT
Development Tools By Supplier
FSICEBASE, M68CBL05CE
Minimum Operating Temperature
- 40 C
On-chip Adc
8 bit, 8 Channel
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
Lead Free Status / Rohs Status
 Details

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8.11.2 Parametric Influences on Reaction Time
MC68HC908MR8 — Rev 4.1
Freescale Semiconductor
The discrepancy in these definitions makes it difficult to specify an
acquisition or lock time for a typical PLL. Therefore, the definitions for
acquisition and lock times for this module are:
Obviously, the acquisition and lock times can vary according to how
large the frequency error is and may be shorter or longer in many cases.
Acquisition and lock times are designed to be as short as possible while
still providing the highest possible stability. These reaction times are not
constant, however. Many factors directly and indirectly affect the
acquisition time.
The most critical parameter which affects the reaction times of the PLL
is the reference frequency, f
detector and controls how often the PLL makes corrections. For stability,
the corrections must be small compared to the desired frequency, so
several corrections are required to reduce the frequency error.
Therefore, the slower the reference the longer it takes to make these
corrections. This parameter is also under user control via the choice of
crystal frequency, f
Acquisition time, t
between the actual output frequency and the desired output
frequency to less than the tracking mode entry tolerance, ∆
Acquisition time is based on an initial frequency error,
(f
bandwidth control mode (see
Bandwidth
becomes set in the PLL bandwidth control register (PBWC).
Lock time, t
between the actual output frequency and the desired output
frequency to less than the lock mode entry tolerance, ∆
time is based on an initial frequency error, (f
not more than ± 100 percent. In automatic bandwidth control
mode, lock time expires when the LOCK bit becomes set in the
PLL bandwidth control register (PBWC). See
Automatic PLL Bandwidth
DES
Clock Generator Module (CGM)
– f
ORIG
Lock
Modes), acquisition time expires when the ACQ bit
)/f
XCLK
DES
, is the time the PLL takes to reduce the error
ACQ
.
, of not more than ±100 percent. In automatic
, is the time the PLL takes to reduce the error
RDV
. This frequency is the input to the phase
Modes.
8.4.2.3 Manual and Automatic PLL
Acquisition/Lock Time Specifications
Clock Generator Module (CGM)
DES
8.4.2.3 Manual and
–f
ORIG
Technical Data
)/f
Lock
DES
. Lock
TRK
, of
135
.

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