ep2s130 Altera Corporation, ep2s130 Datasheet - Page 160

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ep2s130

Manufacturer Part Number
ep2s130
Description
Stratix Ii Device Family Data Sheet
Manufacturer
Altera Corporation
Datasheet

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Timing Model
5–24
Stratix II Device Handbook, Volume 1
Notes to
(1)
(2)
(3)
(4)
(5)
LVTTL
LVCMOS
2.5 V
1.8 V
1.5 V
PCI
PCI-X
SSTL-2 Class I
SSTL-2 Class II
SSTL-18 Class I
SSTL-18 Class II
1.8-V HSTL Class I
1.8-V HSTL Class II
1.5-V HSTL Class I
1.5-V HSTL Class II
1.2-V HSTL with OCT
Differential SSTL-2 Class I
Differential SSTL-2 Class II
Differential SSTL-18 Class I
Differential SSTL-18 Class II
1.5-V Differential HSTL Class I
1.5-V Differential HSTL Class II
1.8-V Differential HSTL Class I
1.8-V Differential HSTL Class II
LVDS
HyperTransport
LVPECL
Table 5–34. Output Timing Measurement Methodology for Output Pins
(5)
Input measurement point at internal node is 0.5 × V
Output measuring point for V
Input stimulus edge rate is 0 to V
Less than 50-mV ripple on V
V
(4)
(4)
(4)
CCPD
(5)
(4)
Table
I/O Standard
(4)
= 2.97 V, less than 50-mV ripple on V
5–34:
CCIO
MEAS
R
S
CC
and V
50
25
50
50
25
50
50
25
25
25
25
25
50
50
25
(Ω)
at buffer output is 0.5 × V
in 0.2 ns (internal signal) from the driver preceding the I/O buffer.
CCPD
R
CCIO
, V
100
100
100
D
(Ω)
CCINT
and V
Loading and Termination
CCINT
= 1.15 V with less than 30-mV ripple
CCPD
R
T
50
25
50
25
50
25
50
25
50
25
50
25
50
25
50
25
.
(Ω)
, V
CCIO
CCINT
V
.
CCIO
3.135
3.135
2.375
1.710
1.425
2.970
2.970
2.325
2.325
1.660
1.660
1.660
1.660
1.375
1.375
1.140
2.325
2.325
1.660
1.660
1.375
1.375
1.660
1.660
2.325
2.325
3.135
= 1.15 V
(V)
V
Notes
1.123
1.123
0.790
0.790
0.790
0.790
0.648
0.648
1.123
1.123
0.790
0.790
0.648
0.648
0.790
0.790
TT
(V)
(1), (2),
C
L
10
10
(pF)
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Altera Corporation
(3)
Measurement
V
1.5675
1.5675
1.1875
0.7125
1.1625
1.1625
0.6875
0.6875
1.1625
1.1625
0.6875
0.6875
1.1625
1.1625
1.5675
MEAS
0.855
1.485
1.485
0.570
Point
May 2007
0.83
0.83
0.83
0.83
0.83
0.83
0.83
0.83
(V)

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