ep2s130 Altera Corporation, ep2s130 Datasheet - Page 163

• Manufacturer Part Number: ep2s130
• Description: Stratix Ii Device Family Data Sheet
• Manufacturer: Altera Corporation

Altera Corporation
May 2007
Notes to
(1)
(2)
(3)
(4)
(5)
(6)
1.8-V HSTL Class II
1.5-V HSTL Class I
1.5-V HSTL Class II
1.2-V HSTL with OCT
Differential SSTL-2 Class I
Differential SSTL-2 Class II
Differential SSTL-18 Class I
Differential SSTL-18 Class II
1.5-V Differential HSTL Class I
1.5-V Differential HSTL Class II
1.8-V Differential HSTL Class I
1.8-V Differential HSTL Class II
LVDS
HyperTransport
LVPECL
Table 5–35. Timing Measurement Methodology for Input Pins (Part 2 of 2)
Input buffer sees no load at buffer input.
Input measuring point at buffer input is 0.5 × V
Output measuring point is 0.5 × V
Input edge rate is 1 V/ns.
Less than 50-mV ripple on V
V
CCPD
Table
= 2.97 V, less than 50-mV ripple on V
I/O Standard
5–35:
Performance
Table 5–36
performance values were obtained with the Quartus II software
compilation of library of parameterized modules (LPM), or MegaCore
functions for the finite impulse response (FIR) and fast Fourier transform
(FFT) designs.
CCIO
and V
CC
at internal node.
CCPD
shows Stratix II performance for some common designs. All
V
CCIO
, V
CCIO
1.660
1.375
1.375
1.140
2.325
2.325
1.660
1.660
1.375
1.375
1.660
1.660
2.325
2.325
3.135
CCINT
CCIO
and V
(V)
Measurement Conditions
.
= 1.15 V with less than 30-mV ripple
CCPD
, V
V
0.830
0.688
0.688
0.570
1.163
1.163
0.830
0.830
0.688
0.688
0.830
0.830
REF
CCINT
(V)
= 1.15 V
Stratix II Device Handbook, Volume 1
Edge Rate (ns)
DC & Switching Characteristics
1.660
1.375
1.375
1.140
2.325
2.325
1.660
1.660
1.375
1.375
1.660
1.660
0.100
0.400
0.100
Notes (1)–(4)
Measurement Point
V
M E A S
0.6875
0.6875
0.6875
0.6875
1.1625
1.1625
1.5675
1.1625
1.1625
0.570
0.83
0.83
0.83
0.83
0.83
(V)
5–27
®