IC MCU 8BIT OTP 4K 20 PDIP

ST62T20CB6

Manufacturer Part NumberST62T20CB6
DescriptionIC MCU 8BIT OTP 4K 20 PDIP
ManufacturerSTMicroelectronics
SeriesST6
ST62T20CB6 datasheet
 


Specifications of ST62T20CB6

Core ProcessorST6Core Size8-Bit
Speed8MHzPeripheralsLVD, POR, WDT
Number Of I /o12Program Memory Size4KB (4K x 8)
Program Memory TypeOTPRam Size64 x 8
Voltage - Supply (vcc/vdd)3 V ~ 6 VData ConvertersA/D 8x8b
Oscillator TypeInternalOperating Temperature-40°C ~ 85°C
Package / Case20-DIP (0.300", 7.62mm)Controller Family/seriesST6
No. Of I/o's12Ram Memory Size64Byte
Cpu Speed8MHzNo. Of Timers1
Rohs CompliantYesProcessor SeriesST62T2x
CoreST6Data Bus Width8 bit
Data Ram Size64 BMaximum Clock Frequency8 MHz
Number Of Programmable I/os12Number Of Timers2
Operating Supply Voltage3 V to 6 VMaximum Operating Temperature+ 85 C
Mounting StyleThrough HoleDevelopment Tools By SupplierST622XC-KIT/110, ST62GP-EMU2, ST62E2XC-EPB/110, ST62E6XC-EPB/US, STREALIZER-II
Minimum Operating Temperature- 40 COn-chip Adc8 bit
Lead Free Status / RoHS StatusLead free / RoHS CompliantEeprom Size-
Connectivity-Other names497-2098-5
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
37
38
39
40
41
42
43
44
45
46
47
48
49
50
51
52
53
54
55
56
57
58
59
60
61
62
63
64
65
66
67
68
69
70
71
Page 71
72
Page 72
73
Page 73
74
Page 74
75
Page 75
76
Page 76
77
Page 77
78
Page 78
79
Page 79
80
Page 80
81
82
83
84
85
86
87
88
89
90
91
92
93
94
95
96
97
98
99
100
101
102
103
104
Page 79/104

Download datasheet (2Mb)Embed
PrevNext
EMC CHARACTERISTICS (Cont’d)
10.7.2.2 Static and Dynamic Latch-Up
LU: 3 complementary static tests are required
on 10 parts to assess the latch-up performance.
A supply overvoltage (applied to each power
supply pin), a current injection (applied to each
input, output and configurable I/O pin) and a
power supply switch sequence are performed
on each sample. This test conforms to the EIA/
JESD 78 IC latch-up standard. For more details,
refer to the AN1181 application note.
Electrical Sensitivities
Symbol
Parameter
LU
Static latch-up class
DLU
Dynamic latch-up class
Notes:
1. Class description: A Class is an STMicroelectronics internal specification. All its limits are higher than the JEDEC spec-
ifications, that means when a device belongs to Class A it exceeds the JEDEC standard. B Class strictly covers all the
JEDEC criteria (international standard).
2. Schaffner NSG435 with a pointed test finger.
Figure 58. Simplified Diagram of the ESD Generator for DLU
R
=50MΩ
CH
=150pF
C
S
ESD
2)
GENERATOR
ST6208C/ST6209C/ST6210C/ST6220C
DLU: Electro-Static Discharges (one positive
then one negative test) are applied to each pin
of 3 samples when the micro is running to
assess the latch-up performance in dynamic
mode. Power supplies are set to the typical
values, the oscillator is connected as near as
possible to the pins of the micro and the
component is put in reset mode. This test
conforms to the IEC1000-4-2 and SAEJ1752/3
standards and is described in
more details, refer to the AN1181 application
note.
Conditions
=+25°C
T
A
=+85°C
T
A
=5V, f
=4MHz, T
V
DD
OSC
R
=330Ω
DISCHARGE TIP
D
HV RELAY
DISCHARGE
RETURN CONNECTION
Figure
58. For
1)
Class
A
A
=+25°C
A
A
V
DD
V
SS
ST6
79/104
1