xrt94l33 Exar Corporation, xrt94l33 Datasheet - Page 385

• Manufacturer Part Number: xrt94l33
• Description: Multi-channel, Multi-function Device Aggregates 3 Ds3/e3/sts-1 Into Oc3/stm-1
• Manufacturer: Exar Corporation

xr
3-CHANNEL DS3/E3/STS-1 TO STS-3/STM-1 MAPPER IC DATA SHEET
2.3.1.15
2.3.1.16
2.3.1.17
2.3.1.18
2.3.1.19
2.3.1.20
As described throughout much of this section the Receive STS-3 TOH Processor block will generate
an interrupt in response to any of the following conditions.
• Change in the LOS Defect Condition
• Change in the SEF Defect Condition
• Change in the LOF Defect Condition
• Change in the AIS-L Defect Condition
• Change in the SD Defect Condition
• Change in the SF Defect Condition
• Change in the Section-Trace Message Mismatch Defect Condition
2.3.1.20.1
2.3.1.20.2
2.3.1.20.3
2.3.1.20.4
2.3.1.20.5
2.3.1.20.6
2.3.1.20.7
2.3.1.20.8
2.3.1.20.9
2.3.1.20.10
2.3.1.20.11
2.3.1.21
The XRT94L33 supports Performance Monitoring by providing 32-bit Reset-upon-Read Registers, that track
the following parameters.
• B1 Byte Errors
• B2 Byte Errors
• Number of REI-L Events
HANDLING/SUPPORT OF THE INCOMING K1, K2 BYTES
HANDLING/SUPPORT OF THE INCOMING LINE DCC (D4 – D12) BYTES
HANDLING/SUPPORT OF THE INCOMING S1 BYTE
HANDLING/SUPPORT OF THE INCOMING M1 BYTE
HANDLING/SUPPORT OF THE INCOMING E2 BYTE
RECEIVE STS-3 TOH PROCESSOR BLOCK INTERRUPTS
RECEIVE STS-3 TOH PROCESSOR BLOCK PERFORMANCE MONITORING PARAMETERS
CHANGE OF LOS DEFECT CONDITION INTERRUPT
CHANGE OF SEF DEFECT CONDITION INTERRUPT
CHANGE OF LOF DEFECT CONDITION INTERRUPT
CHANGE OF SD (SIGNAL DEGRADE) DEFECT CONDITION INTERRUPT
CHANGE OF SF (SIGNAL FAIL) DEFECT CONDITION
CHANGE OF SECTION TRACE MESSAGE MISMATCH DEFECT CONDITION
CHANGE OF SECTION TRACE MESSAGE UNSTABLE DEFECT CONDITION
CHANGE OF AIS-L DEFECT CONDITION INTERRUPT
DETECTION OF B1 BYTE ERROR INTERRUPT
DETECTION OF REI-L INTERRUPT
DETECTION OF B2 BYTE ERROR INTERRUPT
385
XRT94L33
Rev.1.2.0.