AT91SAM7S32-AI ATMEL [ATMEL Corporation], AT91SAM7S32-AI Datasheet - Page 35

• Manufacturer Part Number: AT91SAM7S32-AI
• Description: AT91 ARM Thumb-based Microcontrollers
• Manufacturer: ATMEL [ATMEL Corporation]

Test Environment
Figure 12. Application Test Environment Example
Debug and Test
Pin Description
6071A–ATARM–28-Oct-04
Figure 12 on page 35 shows a test environment example. Test vectors are sent and inter-
preted by the tester. In this example, the “board in test” is designed using a number of JTAG-
compliant devices. These devices can be connected to form a single scan chain.
Table 9. Debug and Test Pin List
Pin Name
NRST
TST
TCK
TDI
TDO
TMS
JTAGSEL
DRXD
DTXD
AT91SAM7Sxx-based Application Board In Test
Connector
ICE/JTAG
AT91SAM7Sxx
Interface
JTAG
Chip n
Test Adaptor
Function
Microcontroller Reset
Test Mode Select
Test Clock
Test Data In
Test Data Out
Test Mode Select
JTAG Selection
Debug Receive Data
Debug Transmit Data
Chip 2
Chip 1
ICE and JTAG
Debug Unit
Reset/Test
AT91SAM7S32 Preliminary
Tester
Input/Output
Output
Output
Type
Input
Input
Input
Input
Input
Input
Active Level
High
Low
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