MCF5282CVF80J Freescale Semiconductor, MCF5282CVF80J Datasheet - Page 666

• Manufacturer Part Number: MCF5282CVF80J
• Description: IC MPU 512K FLASH 256MAPBGA
• Manufacturer: Freescale Semiconductor
• Series: MCF528xr

Specifications of MCF5282CVF80J

• Core Processor: Coldfire V2
• Core Size: 32-Bit
• Speed: 80MHz
• Connectivity: CAN, EBI/EMI, Ethernet, I²C, SPI, UART/USART
• Peripherals: DMA, LVD, POR, PWM, WDT
• Number Of I /o: 150
• Program Memory Size: 512KB (512K x 8)
• Program Memory Type: FLASH
• Ram Size: 64K x 8
• Voltage - Supply (vcc/vdd): 2.7 V ~ 3.6 V
• Data Converters: A/D 8x10b
• Oscillator Type: External
• Operating Temperature: -40°C ~ 85°C
• Package / Case: 256-MAPBGA
• Processor Series: MCF528x
• Core: ColdFire V2
• 3rd Party Development Tools: JLINK-CF-BDM26, EWCF
• Development Tools By Supplier: NNDK-MOD5282-KIT
• Lead Free Status / RoHS Status: Contains lead / RoHS non-compliant
• Eeprom Size: -
• Lead Free Status / Rohs Status: No

IEEE 1149.1 Test Access Port (JTAG)
31.1
The basic features of the JTAG module are the following:
31.2
The JTAG_EN pin can select between the following modes of operation:
31.3
The JTAG module has five input and one output external signals, as described in
31.3.1
31.3.1.1 JTAG_EN — JTAG Enable
The JTAG_EN pin selects between Debug module and JTAG. If JTAG_EN is low, the Debug module is
selected; if it is high, the JTAG is selected.
upon JTAG_EN logic state.
31-2
TRST/DSCLK
TMS/BKPT
TDO/DSO
•
•
•
•
•
•
•
JTAG_EN
TDI/DSI
Name
TCLK
Performs boundary-scan operations to test circuit board electrical continuity
Bypasses instruction to reduce the shift register path to a single cell
Sets chip output pins to safety states while executing the bypass instruction
Samples the system pins during operation and transparently shift out the result
Selects between JTAG TAP controller and Background Debug Module (BDM) using a dedicated
JTAG_EN pin
JTAG mode
BDM - background debug mode (For more information, refer to
Mode
Features
Modes of Operation
External Signal Description
Detailed Signal Description
(BDM)).”
Direction
Output
Input
Input
Input
Input
Input
MCF5282 and MCF5216 ColdFire Microcontroller User’s Manual, Rev. 3
JTAG Test data output / BDM Development serial output
JTAG Test reset input / BDM Development serial clock
JTAG Test data input / BDM Development serial input
JTAG Test mode select / BDM Breakpoint
Table 31-2. Pin Function Selected
Table 31-1. Signal Properties
JTAG_EN = 0
JTAG/BDM selector input
JTAG Test clock input
Table 31-2
Function
summarizes the pin function selected depending
JTAG_EN = 1
Section 30.5, “Background Debug
Reset State
Pin Name
Hi-Z / 0
Table
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Freescale Semiconductor
31-1.
Pull up
Active
Active
Active
Active
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