PNX1500E NXP Semiconductors, PNX1500E Datasheet - Page 748
PNX1500E
Manufacturer Part Number
PNX1500E
Description
Manufacturer
NXP Semiconductors
Datasheet
1.PNX1500E.pdf
(828 pages)
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PNX15XX_PNX952X_SER_N_4
Product data sheet
2.1.2 TAP Controller
TDO is the serial output for test instructions and data from the TAP controller.
Changes in the state of TDO must occur at the falling edge of TCK. This is because
devices connected to TDO are required to sample TDO at the rising edge of TCK.
The TDO driver must be in an inactive state (i.e., TDO line HIghZ) except when the
scanning of data is in progress.
The TAP controller is a finite state machine that synchronously responds to changes
in TCK and TMS signals. The TAP instructions and data are serially scanned into the
TAP controller’s instruction and data registers via the common input line TDI. The
TMS signal tells the TAP controller to select either the TAP instruction register or a
TAP data registers as the destination for serial input from the common line TDI. An
instruction scanned into the instruction register selects a data register to be
connected between TDI and TDO to become the destination for serial data input.
The TAP controller’s state changes are determined by the TMS signal. The states are
used for scanning in/out TAP instruction and data, updating instruction, and data
registers, and for executing instructions.
Rev. 4.0 — 03 December 2007
PNX15xx/952x Series
Chapter 24: TM3260 Debug
© NXP B.V. 2007. All rights reserved.
24-748
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