ST72C334J4T6 STMicroelectronics, ST72C334J4T6 Datasheet - Page 123

MCU 8BIT FLASH SPI SCI 44TQFP

ST72C334J4T6

Manufacturer Part Number
ST72C334J4T6
Description
MCU 8BIT FLASH SPI SCI 44TQFP
Manufacturer
STMicroelectronics
Series
ST7r
Datasheet

Specifications of ST72C334J4T6

Core Processor
ST7
Core Size
8-Bit
Speed
16MHz
Connectivity
SCI, SPI
Peripherals
LVD, POR, PWM, WDT
Number Of I /o
32
Program Memory Size
16KB (16K x 8)
Program Memory Type
FLASH
Eeprom Size
256 x 8
Ram Size
512 x 8
Voltage - Supply (vcc/vdd)
3.2 V ~ 5.5 V
Data Converters
A/D 6x8b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
44-TQFP, 44-VQFP
Processor Series
ST72C3x
Core
ST7
Data Bus Width
8 bit
Data Ram Size
512 B
Interface Type
SCI, SPI
Maximum Clock Frequency
8 MHz
Number Of Programmable I/os
32
Number Of Timers
4 bit
Operating Supply Voltage
3.2 V to 5.5 V
Maximum Operating Temperature
+ 85 C
Mounting Style
SMD/SMT
Development Tools By Supplier
ST7C334-INDART, ST7MDT2-EPB2/US
Minimum Operating Temperature
- 40 C
On-chip Adc
8 bit
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Other names
497-4838

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16.7 EMC CHARACTERISTICS
Susceptibility tests are performed on a sample ba-
sis during product characterization.
16.7.1 Functional EMS
(Electro Magnetic Susceptibility)
Based on a simple running application on the
product (toggling 2 LEDs through I/O ports), the
product is stressed by two electro magnetic events
until a failure occurs (indicated by the LEDs).
Figure 74. EMC Recommended star network power supply connection
Notes:
1. Data based on characterization results, not tested in production.
2. The suggested 10 F and 0.1 F decoupling capacitors on the power supply lines are proposed as a good price vs. EMC
performance trade-off. They have to be put as close as possible to the device power supply pins. Other EMC recommen-
dations are given in other sections (I/Os, RESET, OSCx pin characteristics).
Symbol
V
V
FESD
FFTB
POWER
SUPPLY
SOURCE
Voltage limits to be applied on any I/O pin
to induce a functional disturbance
Fast transient voltage burst limits to be ap-
plied through 100pF on V
to induce a functional disturbance
V
DD
Parameter
DD
ST7
DIGITAL NOISE
FILTERING
and V
DD
pins
EXTERNAL
NOISE
FILTERING
10 F
V
conforms to IEC 1000-4-2
V
conforms to IEC 1000-4-4
DD
DD
0.1 F
A device reset allows normal operations to be re-
sumed.
5V, T
5V, T
0.1 F
ESD: Electro-Static Discharge (positive and
negative) is applied on all pins of the device until
a functional disturbance occurs. This test
conforms with the IEC 1000-4-2 standard.
FTB: A Burst of Fast Transient voltage (positive
and negative) is applied to V
a 100pF capacitor, until a functional disturbance
occurs. This test conforms with the IEC 1000-4-
4 standard.
Conditions
A
A
ST72334J/N, ST72314J/N, ST72124J
+25°C, f
+25°C, f
V
V
V
V
DD
SS
SSA
DDA
OSC
OSC
ST72XXX
8MHz
8MHz
2)
Neg
-1
-4
DD
1)
and V
Pos
1
4
SS
1)
through
123/153
Unit
kV

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