ST7FMC1K2B3 STMICROELECTRONICS [STMicroelectronics], ST7FMC1K2B3 Datasheet - Page 263

• Manufacturer Part Number: ST7FMC1K2B3
• Manufacturer: STMICROELECTRONICS [STMicroelectronics]

EMC CHARACTERISTICS (Cont’d)
12.7.3 Absolute Maximum Ratings (Electrical
Sensitivity)
Based on two different tests (ESD and LU) using
specific measurement methods, the product is
stressed in order to determine its performance in
terms of electrical sensitivity. For more details, re-
fer to the application note AN1181.
Absolute Maximum Ratings
Notes:
1. Data based on characterization results, not tested in production.
12.7.3.2 Static Latch-Up
■
Electrical Sensitivities
Notes:
1. Class description: A Class is an STMicroelectronics internal specification. All its limits are higher than the JEDEC spec-
ifications, that means when a device belongs to Class A it exceeds the JEDEC standard. B Class strictly covers all the
JEDEC criteria (international standard).
V
V
LU: two complementary static tests are required
on 10 parts to assess the latch-up performance.
A supply overvoltage (applied to each power
Symbol
Symbol
ESD(CDM)
ESD(HBM)
LU
Electro-static discharge voltage
(Human Body Model)
Electro-static discharge voltage
(Charged Device Model)
Static latch-up class
Parameter
Ratings
T
T
T
T
A
A
A
A
=+25°C
=+25°C
=+25°C
=+125°C
12.7.3.1 Electro-Static Discharge (ESD)
Electro-Static Discharges (a positive then a nega-
tive pulse separated by 1 second) are applied to
the pins of each sample according to each pin
combination. The sample size depends on the
number of supply pins in the device (3 parts*(n+1)
supply pin). Three models can be simulated: Hu-
man Body Model, Machine Model and Charged
Device Model. This test conforms to the JESD22-
A114A/A115A/C101-A standard.
supply pin) and a current injection (applied to
each input, output and configurable I/O pin) are
performed on each sample. This test conforms
to the EIA/JESD 78 IC latch-up standard.
Conditions
Conditions
ST7MC1xx/ST7MC2xx
Maximum value
2000
250
Class
A
A
1)
1)
263/309
Unit
V