ATMEGA324P-A15MZ Atmel, ATMEGA324P-A15MZ Datasheet - Page 237

• Manufacturer Part Number: ATMEGA324P-A15MZ
• Description: MCU AVR 32KB FLASH 15MHZ 44-VQFN
• Manufacturer: Atmel
• Series: AVR® ATmegar

Specifications of ATMEGA324P-A15MZ

• Package / Case: 44-VQFN Exposed Pad
• Voltage - Supply (vcc/vdd): 2.7 V ~ 5.5 V
• Operating Temperature: -40°C ~ 125°C
• Speed: 16MHz
• Number Of I /o: 32
• Eeprom Size: 1K x 8
• Core Processor: AVR
• Program Memory Type: FLASH
• Ram Size: 2K x 8
• Program Memory Size: 32KB (32K x 8)
• Data Converters: A/D 8x10b
• Oscillator Type: Internal
• Peripherals: Brown-out Detect/Reset, POR, PWM, WDT
• Connectivity: I²C, SPI, UART/USART
• Core Size: 8-Bit
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

2503N–AVR–06/08
If the ADC is not to be used during scan, the recommended input values from
be used. The user is recommended not to use the Differential Gain stages during scan. Switch-
cap based gain stages require fast operation and accurate timing which is difficult to obtain
when used in a scan chain. Details concerning operations of the differential gain stage is there-
fore not provided.
The AVR ADC is based on the analog circuitry shown in
mation algorithm implemented in the digital logic. When used in Boundary-scan, the problem is
usually to ensure that an applied analog voltage is measured within some limits. This can easily
be done without running a successive approximation algorithm: apply the lower limit on the digi-
tal DAC[9:0] lines, make sure the output from the comparator is low, then apply the upper limit
on the digital DAC[9:0] lines, and verify the output from the comparator to be high.
The ADC need not be used for pure connectivity testing, since all analog inputs are shared with
a digital port pin as well.
When using the ADC, remember the following:
•
•
•
As an example, consider the task of verifying a 1.5V ± 5% input signal at ADC channel 3 when
the power supply is 5.0V and AREF is externally connected to V
The recommended values from
in
“Actions” describes what JTAG instruction to be used before filling the Boundary-scan Register
with the succeeding columns. The verification should be done on the data scanned out when
scanning in the data on the same row in the table.
Table
The Port Pin for the ADC channel in use must be configured to be an input with pull-up
disabled to avoid signal contention.
In Normal mode, a dummy conversion (consisting of 10 comparisons) is performed when
enabling the ADC. The user is advised to wait at least 200 ns after enabling the ADC before
controlling/observing any ADC signal, or perform a dummy conversion before using the first
result.
The DAC values must be stable at the midpoint value 0x200 when having the HOLD signal
low (Sample mode).
92. Only the DAC and Port Pin values of the Scan-chain are shown. The column
The lower limit is:
The upper limit is:
Table 91
1024 1,5V 0,95 5V
1024 1,5V 1,05 5V
are used unless other values are given in the algorithm
⋅
⋅
⋅
⋅
⁄
⁄
Figure 123
=
=
291
323
CC
.
=
=
0x123
0x143
with a successive approxi-
ATmega32(L)
Table 91
should
237