MT29F4G08ABADAWP:D Micron Technology Inc, MT29F4G08ABADAWP:D Datasheet - Page 50

• Manufacturer Part Number: MT29F4G08ABADAWP:D
• Description: MICMT29F4G08ABADAWP:D 4GB SLC NAND 34NM
• Manufacturer: Micron Technology Inc

Specifications of MT29F4G08ABADAWP:D

• Lead Free Status / Rohs Status: Supplier Unconfirmed

GET FEATURES (EEh)
Figure 31: GET FEATURES (EEh) Operation
PDF: 09005aef83b25735
m60a_4gb_nand.pdf – Rev. G 11/10 EN
The GET FEATURES (EEh) command reads the subfeature parameters (P1–P4) from the
specified feature address. This command is accepted by the target only when all die
(LUNs) on the target are idle.
Writing EEh to the command register puts the target in get features mode. The target
stays in this mode until another valid command is issued.
When the EEh command is followed by a feature address, the target goes busy for
t
tion, the READ MODE (00h) command must be used to re-enable data output mode.
After
eters.
Cycle type
FEAT. If the READ STATUS (70h) command is used to monitor for command comple-
R/B#
I/Ox
t
FEAT completes, the host enables data output mode to read the subfeature param-
Command
EEh
Address
FA
t WB
50
4Gb, 8Gb: x8, x16 NAND Flash Memory
t FEAT
Micron Technology, Inc. reserves the right to change products or specifications without notice.
t RR
D
P1
OUT
D
P2
OUT
Feature Operations
© 2009 Micron Technology, Inc. All rights reserved.
D
P3
OUT
D
P4
OUT