MT29F4G08ABADAWP:D Micron Technology Inc, MT29F4G08ABADAWP:D Datasheet - Page 63

• Manufacturer Part Number: MT29F4G08ABADAWP:D
• Description: MICMT29F4G08ABADAWP:D 4GB SLC NAND 34NM
• Manufacturer: Micron Technology Inc

Specifications of MT29F4G08ABADAWP:D

• Lead Free Status / Rohs Status: Supplier Unconfirmed

READ MODE (00h)
READ PAGE (00h-30h)
PDF: 09005aef83b25735
m60a_4gb_nand.pdf – Rev. G 11/10 EN
For READ PAGE CACHE series (31h, 00h-31h, 3Fh), during the die (LUN) busy time,
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(70h, 78h) and RESET (FFh). When RDY = 1 and ARDY = 0, the only valid commands
during READ PAGE CACHE series (31h, 00h-31h) operations are status operations (70h,
78h), READ MODE (00h), two-plane read cache series (31h, 00h-00h-30h, 00h-31h), RAN-
DOM DATA READ (06h-E0h, 05h-E0h), and RESET (FFh).
The READ MODE (00h) command disables status output and enables data output for
the last-selected die (LUN) and cache register after a READ operation (00h-30h,
00h-3Ah, 00h-35h) has been monitored with a status operation (70h, 78h). This com-
mand is accepted by the die (LUN) when it is ready (RDY = 1, ARDY = 1). It is also
accepted by the die (LUN) during READ PAGE CACHE (31h, 00h-31h) operations
(RDY = 1 and ARDY = 0).
In devices that have more than one die (LUN) per target, during and following inter-
leaved die (multi-LUN) operations, the READ STATUS ENHANCED (78h) command
must be used to select only one die (LUN) prior to issuing the READ MODE (00h) com-
mand. This prevents bus contention.
The READ PAGE (00h–30h) command copies a page from the NAND Flash array to its
respective cache register and enables data output. This command is accepted by the die
(LUN) when it is ready (RDY = 1, ARDY = 1).
To read a page from the NAND Flash array, write the 00h command to the command
register, then write n address cycles to the address registers, and conclude with the 30h
command. The selected die (LUN) will go busy (RDY = 0, ARDY = 0) for
transferred.
To determine the progress of the data transfer, the host can monitor the target's R/B#
signal or, alternatively, the status operations (70h, 78h) can be used. If the status opera-
tions are used to monitor the LUN's status, when the die (LUN) is ready
(RDY = 1, ARDY = 1), the host disables status output and enables data output by issuing
the READ MODE (00h) command. When the host requests data output, output begins
at the column address specified.
During data output the RANDOM DATA READ (05h-E0h) command can be issued.
When internal ECC is enabled, the READ STATUS (70h) command is required after the
completion of the data transfer (
error occured. (
In devices that have more than one die (LUN) per target, during and following inter-
leaved die (multi-LUN) operations the READ STATUS ENHANCED (78h) command
must be used to select only one die (LUN) prior to the issue of the READ MODE (00h)
command. This prevents bus contention.
The READ PAGE (00h-30h) command is used as the final command of a two-plane read
operation. It is preceded by one or more READ PAGE TWO-PLANE (00h-00h-30h) com-
mands. Data is transferred from the NAND Flash array for all of the addressed planes to
their respective cache registers. When the die (LUN) is ready
(RDY = 1, ARDY = 1), data output is enabled for the cache register linked to the plane
addressed in the READ PAGE (00h-30h) command. When the host requests data output,
RCBSY, when RDY = 0 and ARDY = 0, the only valid commands are status operations
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R_ECC is the data transferred with internal ECC enabled.)
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R_ECC) to determine whether an uncorrectable read
4Gb, 8Gb: x8, x16 NAND Flash Memory
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© 2009 Micron Technology, Inc. All rights reserved.
Read Operations
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R as data is