AT91SAM9261-CJ-999 Atmel, AT91SAM9261-CJ-999 Datasheet - Page 57

• Manufacturer Part Number: AT91SAM9261-CJ-999
• Description: IC MCU ARM9 ULTRA LP 217LFBGA
• Manufacturer: Atmel
• Series: AT91SAMr

Specifications of AT91SAM9261-CJ-999

• Core Processor: ARM9
• Core Size: 16/32-Bit
• Speed: 190MHz
• Connectivity: EBI/EMI, I²C, MMC, SPI, SSC, UART/USART, USB
• Peripherals: DMA, LCD, POR, PWM, WDT
• Number Of I /o: 96
• Program Memory Size: 32KB (32K x 8)
• Program Memory Type: ROM
• Ram Size: 192K x 8
• Voltage - Supply (vcc/vdd): 1.08 V ~ 1.32 V
• Oscillator Type: Internal
• Operating Temperature: -40°C ~ 85°C
• Package / Case: 217-LFBGA
• For Use With: AT91SAM9261-EK - KIT EVAL FOR AT91SAM926EJ-SAT91SAM-ICE - EMULATOR FOR AT91 ARM7/ARM9
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Eeprom Size: -
• Data Converters: -

12. AT91SAM9261 Debug and Test
12.1
12.2
6062M–ATARM–23-Mar-09
Overview
Block Diagram
The AT91SAM9261 features a number of complementary debug and test capabilities. A com-
mon JTAG/ICE (In-Circuit Emulator) port is used for standard debugging functions, such as
downloading code and single-stepping through programs. An ETM (Embedded Trace Macrocell)
provides more sophisticated debug features such as address and data comparators, half-rate
clock mode, counters, sequencer and FIFO. The Debug Unit provides a two-pin UART that can
be used to upload an application into internal SRAM. It manages the interrupt handling of the
internal COMMTX and COMMRX signals that trace the activity of the Debug Communication
Channel.
A set of dedicated debug and test input/output pins gives direct access to these capabilities from
a PC-based test environment.
Figure 12-1. Debug and Test Block Diagram
TAP: Test Access Port
PDC
ARM9EJ-S
Boundary
ARM926EJ-S
Port
DBGU
ICE-RT
ICE/JTAG
TAP
ETM
AT91SAM9261 Preliminary
2
Reset
Test
and
POR
TMS
TCK
TDI
JTAGSEL
TDO
DTXD
DRXD
RTCK
TST
TPK0-TPK15
TPS0-TPS2
TSYNC
TCLK
NTRST
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