MCU AVR 16K FLASH 16MHZ 40-PDIP

ATMEGA16A-PU

Manufacturer Part NumberATMEGA16A-PU
DescriptionMCU AVR 16K FLASH 16MHZ 40-PDIP
ManufacturerAtmel
SeriesAVR® ATmega
ATMEGA16A-PU datasheets
 


Specifications of ATMEGA16A-PU

Core ProcessorAVRCore Size8-Bit
Speed16MHzConnectivityI²C, SPI, UART/USART
PeripheralsBrown-out Detect/Reset, POR, PWM, WDTNumber Of I /o32
Program Memory Size16KB (8K x 16)Program Memory TypeFLASH
Eeprom Size512 x 8Ram Size1K x 8
Voltage - Supply (vcc/vdd)2.7 V ~ 5.5 VData ConvertersA/D 8x10b
Oscillator TypeInternalOperating Temperature-40°C ~ 85°C
Package / Case40-DIP (0.600", 15.24mm)Processor SeriesATMEGA16x
CoreAVR8Data Bus Width8 bit
Data Ram Size1 KBInterface Type2-Wire/SPI/USART
Maximum Clock Frequency16 MHzNumber Of Programmable I/os32
Number Of Timers3Maximum Operating Temperature+ 85 C
Mounting StyleThrough Hole3rd Party Development ToolsEWAVR, EWAVR-BL
Development Tools By SupplierATAVRDRAGON, ATSTK500, ATSTK600, ATAVRISP2, ATAVRONEKITMinimum Operating Temperature- 40 C
On-chip Adc8-ch x 10-bitPackage40PDIP
Device CoreAVRFamily NameATmega
Maximum Speed16 MHzOperating Supply Voltage3.3|5 V
Controller Family/seriesAVR MEGANo. Of I/o's32
Eeprom Memory Size512ByteRam Memory Size1KB
Cpu Speed16MHzRohs CompliantYes
For Use WithATSTK600 - DEV KIT FOR AVR/AVR32ATSTK500 - PROGRAMMER AVR STARTER KITLead Free Status / RoHS StatusLead free / RoHS Compliant
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23. JTAG Interface and On-chip Debug System
23.1
Features
JTAG (IEEE std. 1149.1 Compliant) Interface
Boundary-scan Capabilities According to the IEEE std. 1149.1 (JTAG) Standard
Debugger Access to:
– All Internal Peripheral Units
– Internal and External RAM
– The Internal Register File
– Program Counter
– EEPROM and Flash Memories
– Extensive On-chip Debug Support for Break Conditions, Including
– AVR Break Instruction
– Break on Change of Program Memory Flow
– Single Step Break
– Program Memory Breakpoints on Single Address or Address Range
– Data Memory Breakpoints on Single Address or Address Range
Programming of Flash, EEPROM, Fuses, and Lock Bits through the JTAG Interface
On-chip Debugging Supported by AVR Studio
23.2
Overview
The AVR IEEE std. 1149.1 compliant JTAG interface can be used for
• Testing PCBs by using the JTAG Boundary-scan capability
• Programming the non-volatile memories, Fuses and Lock bits
• On-chip Debugging
A brief description is given in the following sections. Detailed descriptions for Programming via
the JTAG interface, and using the Boundary-scan Chain can be found in the sections
ming via the JTAG Interface” on page 280
232, respectively. The On-chip Debug support is considered being private JTAG instructions,
and distributed within ATMEL and to selected third party vendors only.
Figure 23-1
TAP Controller is a state machine controlled by the TCK and TMS signals. The TAP Controller
selects either the JTAG Instruction Register or one of several Data Registers as the scan chain
(Shift Register) between the TDI input and TDO output. The Instruction Register holds JTAG
instructions controlling the behavior of a Data Register.
The ID-Register, Bypass Register, and the Boundary-scan Chain are the Data Registers used
for board-level testing. The JTAG Programming Interface (actually consisting of several physical
and virtual Data Registers) is used for JTAG Serial Programming via the JTAG interface. The
Internal Scan Chain and Break Point Scan Chain are used for On-chip Debugging only.
23.3
TAP – Test Access Port
The JTAG interface is accessed through four of the AVR’s pins. In JTAG terminology, these pins
constitute the Test Access Port – TAP. These pins are:
ATmega16A
226
®
and
shows a block diagram of the JTAG interface and the On-chip Debug system. The
“IEEE 1149.1 (JTAG) Boundary-scan” on page
8154B–AVR–07/09
“Program-