MCU AVR 16K FLASH 16MHZ 40-PDIP

ATMEGA16A-PU

Manufacturer Part NumberATMEGA16A-PU
DescriptionMCU AVR 16K FLASH 16MHZ 40-PDIP
ManufacturerAtmel
SeriesAVR® ATmega
ATMEGA16A-PU datasheets
 


Specifications of ATMEGA16A-PU

Core ProcessorAVRCore Size8-Bit
Speed16MHzConnectivityI²C, SPI, UART/USART
PeripheralsBrown-out Detect/Reset, POR, PWM, WDTNumber Of I /o32
Program Memory Size16KB (8K x 16)Program Memory TypeFLASH
Eeprom Size512 x 8Ram Size1K x 8
Voltage - Supply (vcc/vdd)2.7 V ~ 5.5 VData ConvertersA/D 8x10b
Oscillator TypeInternalOperating Temperature-40°C ~ 85°C
Package / Case40-DIP (0.600", 15.24mm)Processor SeriesATMEGA16x
CoreAVR8Data Bus Width8 bit
Data Ram Size1 KBInterface Type2-Wire/SPI/USART
Maximum Clock Frequency16 MHzNumber Of Programmable I/os32
Number Of Timers3Maximum Operating Temperature+ 85 C
Mounting StyleThrough Hole3rd Party Development ToolsEWAVR, EWAVR-BL
Development Tools By SupplierATAVRDRAGON, ATSTK500, ATSTK600, ATAVRISP2, ATAVRONEKITMinimum Operating Temperature- 40 C
On-chip Adc8-ch x 10-bitPackage40PDIP
Device CoreAVRFamily NameATmega
Maximum Speed16 MHzOperating Supply Voltage3.3|5 V
Controller Family/seriesAVR MEGANo. Of I/o's32
Eeprom Memory Size512ByteRam Memory Size1KB
Cpu Speed16MHzRohs CompliantYes
For Use WithATSTK600 - DEV KIT FOR AVR/AVR32ATSTK500 - PROGRAMMER AVR STARTER KITLead Free Status / RoHS StatusLead free / RoHS Compliant
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24. IEEE 1149.1 (JTAG) Boundary-scan
24.1
Features
JTAG (IEEE std. 1149.1 Compliant) Interface
Boundary-scan Capabilities According to the JTAG Standard
Full Scan of all Port Functions as well as Analog Circuitry having Off-chip Connections
Supports the Optional IDCODE Instruction
Additional Public AVR_RESET Instruction to Reset the AVR
24.2
Overview
The Boundary-scan chain has the capability of driving and observing the logic levels on the digi-
tal I/O pins, as well as the boundary between digital and analog logic for analog circuitry having
Off-chip connections. At system level, all ICs having JTAG capabilities are connected serially by
the TDI/TDO signals to form a long Shift Register. An external controller sets up the devices to
drive values at their output pins, and observe the input values received from other devices. The
controller compares the received data with the expected result. In this way, Boundary-scan pro-
vides a mechanism for testing interconnections and integrity of components on Printed Circuits
Boards by using the four TAP signals only.
The four IEEE 1149.1 defined mandatory JTAG instructions IDCODE, BYPASS, SAMPLE/PRE-
LOAD, and EXTEST, as well as the AVR specific public JTAG instruction AVR_RESET can be
used for testing the Printed Circuit Board. Initial scanning of the Data Register path will show the
ID-code of the device, since IDCODE is the default JTAG instruction. It may be desirable to have
the AVR device in Reset during Test mode. If not reset, inputs to the device may be determined
by the scan operations, and the internal software may be in an undetermined state when exiting
the Test mode. Entering reset, the outputs of any Port Pin will instantly enter the high impedance
state, making the HIGHZ instruction redundant. If needed, the BYPASS instruction can be
issued to make the shortest possible scan chain through the device. The device can be set in
the reset state either by pulling the external RESET pin low, or issuing the AVR_RESET instruc-
tion with appropriate setting of the Reset Data Register.
The EXTEST instruction is used for sampling external pins and loading output pins with data.
The data from the output latch will be driven out on the pins as soon as the EXTEST instruction
is loaded into the JTAG IR-Register. Therefore, the SAMPLE/PRELOAD should also be used for
setting initial values to the scan ring, to avoid damaging the board when issuing the EXTEST
instruction for the first time. SAMPLE/PRELOAD can also be used for taking a snapshot of the
external pins during normal operation of the part.
The JTAGEN Fuse must be programmed and the JTD bit in the I/O Register MCUCSR must be
cleared to enable the JTAG Test Access Port.
When using the JTAG interface for Boundary-scan, using a JTAG TCK clock frequency higher
than the internal chip frequency is possible. The chip clock is not required to run.
24.3
Data Registers
The Data Registers relevant for Boundary-scan operations are:
• Bypass Register
• Device Identification Register
• Reset Register
• Boundary-scan Chain
ATmega16A
232
8154B–AVR–07/09