MCU AVR 16K FLASH 16MHZ 40-PDIP

ATMEGA16A-PU

Manufacturer Part NumberATMEGA16A-PU
DescriptionMCU AVR 16K FLASH 16MHZ 40-PDIP
ManufacturerAtmel
SeriesAVR® ATmega
ATMEGA16A-PU datasheets
 


Specifications of ATMEGA16A-PU

Core ProcessorAVRCore Size8-Bit
Speed16MHzConnectivityI²C, SPI, UART/USART
PeripheralsBrown-out Detect/Reset, POR, PWM, WDTNumber Of I /o32
Program Memory Size16KB (8K x 16)Program Memory TypeFLASH
Eeprom Size512 x 8Ram Size1K x 8
Voltage - Supply (vcc/vdd)2.7 V ~ 5.5 VData ConvertersA/D 8x10b
Oscillator TypeInternalOperating Temperature-40°C ~ 85°C
Package / Case40-DIP (0.600", 15.24mm)Processor SeriesATMEGA16x
CoreAVR8Data Bus Width8 bit
Data Ram Size1 KBInterface Type2-Wire/SPI/USART
Maximum Clock Frequency16 MHzNumber Of Programmable I/os32
Number Of Timers3Maximum Operating Temperature+ 85 C
Mounting StyleThrough Hole3rd Party Development ToolsEWAVR, EWAVR-BL
Development Tools By SupplierATAVRDRAGON, ATSTK500, ATSTK600, ATAVRISP2, ATAVRONEKITMinimum Operating Temperature- 40 C
On-chip Adc8-ch x 10-bitPackage40PDIP
Device CoreAVRFamily NameATmega
Maximum Speed16 MHzOperating Supply Voltage3.3|5 V
Controller Family/seriesAVR MEGANo. Of I/o's32
Eeprom Memory Size512ByteRam Memory Size1KB
Cpu Speed16MHzRohs CompliantYes
For Use WithATSTK600 - DEV KIT FOR AVR/AVR32ATSTK500 - PROGRAMMER AVR STARTER KITLead Free Status / RoHS StatusLead free / RoHS Compliant
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Page 243/352

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Table 24-6.
Boundary-scan Signals for the ADC (Continued)
Signal
Direction as Seen
Name
from the ADC
MUXEN_3
Input
MUXEN_2
Input
MUXEN_1
Input
MUXEN_0
Input
NEGSEL_2
Input
NEGSEL_1
Input
NEGSEL_0
Input
PASSEN
Input
PRECH
Input
SCTEST
Input
ST
Input
VCCREN
Input
Note:
Incorrect setting of the switches in
choices to the S&H circuitry on the negative input of the output comparator in
from either one ADC pin, Bandgap reference source, or Ground.
If the ADC is not to be used during scan, the recommended input values from
be used. The user is recommended not to use the Differential Gain stages during scan. Switch-
cap based gain stages require fast operation and accurate timing which is difficult to obtain
when used in a scan chain. Details concerning operations of the differential gain stage is there-
fore not provided.
The AVR ADC is based on the analog circuitry shown in
imation algorithm implemented in the digital logic. When used in Boundary-scan, the problem is
usually to ensure that an applied analog voltage is measured within some limits. This can easily
be done without running a successive approximation algorithm: apply the lower limit on the digi-
tal DAC[9:0] lines, make sure the output from the comparator is low, then apply the upper limit
on the digital DAC[9:0] lines, and verify the output from the comparator to be high.
The ADC need not be used for pure connectivity testing, since all analog inputs are shared with
a digital port pin as well.
When using the ADC, remember the following:
• The Port Pin for the ADC channel in use must be configured to be an input with pull-up
disabled to avoid signal contention.
8154B–AVR–07/09
Description
Input Mux bit 3
Input Mux bit 2
Input Mux bit 1
Input Mux bit 0
Input Mux for negative input for
differential signal, bit 2
Input Mux for negative input for
differential signal, bit 1
Input Mux for negative input for
differential signal, bit 0
Enable pass-gate of gain stages.
Precharge output latch of
comparator. (Active low)
Switch-cap TEST enable. Output
from x10 gain stage send out to
Port Pin having ADC_4
Output of gain stages will settle
faster if this signal is high first two
ACLK periods after AMPEN goes
high.
Selects Vcc as the ACC reference
voltage.
Figure 24-10
will make signal contention and may damage the part. There are several input
ATmega16A
Recommended
Output Values when Recommended
Input when Not
Inputs are used, and CPU is not
in Use
Using the ADC
0
0
0
1
0
0
0
1
1
0
0
0
Figure
24-10. Make sure only one path is selected
Figure 24-10
with a successive approx-
0
0
0
1
0
0
0
1
1
0
0
0
Table 24-6
should
243