AT91SAM7X128-CU Atmel, AT91SAM7X128-CU Datasheet - Page 48

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AT91SAM7X128-CU

Manufacturer Part Number
AT91SAM7X128-CU
Description
MCU ARM 128K HS FLASH 100-TFBGA
Manufacturer
Atmel
Series
AT91SAMr
Datasheet

Specifications of AT91SAM7X128-CU

Core Processor
ARM7
Core Size
16/32-Bit
Speed
55MHz
Connectivity
CAN, Ethernet, I²C, SPI, SSC, UART/USART, USB
Peripherals
Brown-out Detect/Reset, DMA, POR, PWM, WDT
Number Of I /o
62
Program Memory Size
128KB (128K x 8)
Program Memory Type
FLASH
Ram Size
32K x 8
Voltage - Supply (vcc/vdd)
1.65 V ~ 1.95 V
Data Converters
A/D 8x10b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
100-TFBGA
For Use With
AT91SAM-ICE - EMULATOR FOR AT91 ARM7/ARM9AT91SAM7X-EK - KIT EVAL FOR AT91SAM7X256/128
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-

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12.5
12.5.1
12.5.2
12.5.3
12.5.4
48
Functional Description
AT91SAM7X512/256/128 Preliminary
Test Pin
EmbeddedICE
Debug Unit
IEEE 1149.1 JTAG Boundary Scan
One dedicated pin, TST, is used to define the device operating mode. The user must make sure
that this pin is tied at low level to ensure normal operating conditions. Other values associated
with this pin are reserved for manufacturing test.
The ARM7TDMI EmbeddedICE is supported via the ICE/JTAG port. The internal state of the
ARM7TDMI is examined through an ICE/JTAG port.
The ARM7TDMI processor contains hardware extensions for advanced debugging features:
There are three scan chains inside the ARM7TDMI processor that support testing, debugging,
and programming of the EmbeddedICE. The scan chains are controlled by the ICE/JTAG port.
EmbeddedICE mode is selected when JTAGSEL is low. It is not possible to switch directly
between ICE and JTAG operations. A chip reset must be performed after JTAGSEL is changed.
For further details on the EmbeddedICE, see the ARM7TDMI (Rev4) Technical Reference Man-
ual (DDI0210B).
The Debug Unit provides a two-pin (DXRD and TXRD) USART that can be used for several
debug and trace purposes and offers an ideal means for in-situ programming solutions and
debug monitor communication. Moreover, the association with two peripheral data controller
channels permits packet handling of these tasks with processor time reduced to a minimum.
The Debug Unit also manages the interrupt handling of the COMMTX and COMMRX signals
that come from the ICE and that trace the activity of the Debug Communication Channel. The
Debug Unit allows blockage of access to the system through the ICE interface.
A specific register, the Debug Unit Chip ID Register, gives information about the product version
and its internal configuration.
The AT91SAM7X512 Debug Unit Chip ID value is 0x275C 0A40 on 32-bit width.
The AT91SAM7X256 Debug Unit Chip ID value is 0x275B 0940 on 32-bit width.
The AT91SAM7X128 Debug Unit Chip ID value is 0x275A 0740 on 32-bit width.
For further details on the Debug Unit, see the Debug Unit section.
IEEE 1149.1 JTAG Boundary Scan allows pin-level access independent of the device packaging
technology.
IEEE 1149.1 JTAG Boundary Scan is enabled when JTAGSEL is high. The SAMPLE, EXTEST
and BYPASS functions are implemented. In ICE debug mode, the ARM processor responds
(Embedded In-circuit Emulator)
• In halt mode, a store-multiple (STM) can be inserted into the instruction pipeline. This exports
• In monitor mode, the JTAG interface is used to transfer data between the debugger and a
the contents of the ARM7TDMI registers. This data can be serially shifted out without
affecting the rest of the system.
simple monitor program running on the ARM7TDMI processor.
6120H–ATARM–17-Feb-09

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