DS33Z41 Maxim Integrated Products, DS33Z41 Datasheet - Page 164

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DS33Z41

Manufacturer Part Number
DS33Z41
Description
Network Controller & Processor ICs Quad Inverse-Multipl exing Ethernet Mappe
Manufacturer
Maxim Integrated Products
Datasheet

Specifications of DS33Z41

Lead Free Status / RoHS Status
Lead free / RoHS Compliant

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DS33Z41 Quad IMUX Ethernet Mapper
12.3 JTAG ID Codes
Table 12-2. ID Code Structure
REVISION
DEVICE CODE
MANUFACTURER’S CODE
REQUIRED
DEVICE
ID[31:28]
ID[27:12]
ID[11:1]
ID[0]
DS33Z41
0000
0000 0000 0110 0010
000 1010 0001
1
12.4 Test Registers
IEEE 1149.1 requires a minimum of two test registers; the bypass register and the boundary scan register. An
optional test register has been included with the device design. This test register is the identification register and
is used in conjunction with the IDCODE instruction and the Test-Logic-Reset state of the TAP controller.
12.4.1 Boundary Scan Register
This register contains both a shift register path and a latched parallel output for all control cells and digital I/O cells
and is n bits in length.
12.4.2 Bypass Register
This is a single one-bit shift register used in conjunction with the BYPASS, CLAMP, and HIGHZ instructions,
which provides a short path between JTDI and JTDO.
12.4.3 Identification Register
The identification register contains a 32-bit shift register and a 32-bit latched parallel output. This register is
selected during the IDCODE instruction and when the TAP controller is in the Test-Logic-Reset state.
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