AT32UC3B1128-AUT Atmel, AT32UC3B1128-AUT Datasheet - Page 603

• Manufacturer Part Number: AT32UC3B1128-AUT
• Description: IC MCU AVR32 128KB FLASH 48-TQFP
• Manufacturer: Atmel
• Series: AVR®32 UC3r

Specifications of AT32UC3B1128-AUT

• Core Processor: AVR
• Core Size: 32-Bit
• Speed: 60MHz
• Connectivity: I²C, IrDA, SPI, SSC, UART/USART, USB
• Peripherals: Brown-out Detect/Reset, DMA, POR, PWM, WDT
• Number Of I /o: 28
• Program Memory Size: 128KB (128K x 8)
• Program Memory Type: FLASH
• Ram Size: 32K x 8
• Voltage - Supply (vcc/vdd): 1.65 V ~ 1.95 V
• Data Converters: A/D 6x10b
• Oscillator Type: Internal
• Operating Temperature: -40°C ~ 85°C
• Package / Case: 48-TQFP, 48-VQFP
• Package: 48TQFP
• Device Core: AVR32
• Family Name: AT32
• Maximum Speed: 60 MHz
• Operating Supply Voltage: 1.8|3.3 V
• Data Bus Width: 32 Bit
• Number Of Programmable I/os: 28
• Interface Type: I2S/SPI/TWI/USART/USB
• On-chip Adc: 6-chx10-bit
• Number Of Timers: 3
• For Use With: ATSTK600-TQFP48 - STK600 SOCKET/ADAPTER 48-TQFPATAVRONEKIT - KIT AVR/AVR32 DEBUGGER/PROGRMMR770-1008 - ISP 4PORT ATMEL AVR32 MCU SPIATEVK1101 - KIT DEV/EVAL FOR AVR32 AT32UC3B
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Eeprom Size: -

27.5.2.3
32059K–03/2011
EXTEST
Table 27-11. SAMPLE_PRELOAD Details
This instruction selects the boundary-scan chain as Data Register for testing circuitry external to
the 32-bit AVR package. The contents of the latched outputs of the boundary-scan chain is
driven out as soon as the JTAG IR-register is loaded with the EXTEST instruction.
Starting in Run-Test/Idle, the EXTEST instruction is accessed the following way:
Table 27-12. EXTEST Details
Instructions
IR input value
IR output value
DR Size
DR input value
DR output value
Instructions
IR input value
IR output value
DR Size
DR input value
DR output value
1. Select the IR Scan path.
2. In Capture-IR: The IR output value is latched into the shift register.
3. In Shift-IR: The instruction register is shifted by the TCK input.
4. Return to Run-Test/Idle.
5. Select the DR Scan path.
6. In Capture-DR: The Data on the external pins are sampled into the boundary-scan
7. In Shift-DR: The boundary-scan chain is shifted by the TCK input.
8. Return to Run-Test/Idle.
1. Select the IR Scan path.
2. In Capture-IR: The IR output value is latched into the shift register.
3. In Shift-IR: The instruction register is shifted by the TCK input.
4. In Update-IR: The data from the boundary-scan chain is applied to the output pins.
5. Return to Run-Test/Idle.
6. Select the DR Scan path.
7. In Capture-DR: The data on the external pins is sampled into the boundary-scan chain.
8. In Shift-DR: The boundary-scan chain is shifted by the TCK input.
9. In Update-DR: The data from the scan chain is applied to the output pins.
10. Return to Run-Test/Idle.
chain.
Details
00010 (0x02)
p0001
Depending on boundary-scan chain, see BSDL-file.
Depending on boundary-scan chain, see BSDL-file.
Depending on boundary-scan chain, see BSDL-file.
Details
00011 (0x03)
p0001
Depending on boundary-scan chain, see BSDL-file.
Depending on boundary-scan chain, see BSDL-file.
Depending on boundary-scan chain, see BSDL-file.
AT32UC3B
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