5M1270ZT144C4N Altera, 5M1270ZT144C4N Datasheet - Page 155

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5M1270ZT144C4N

Manufacturer Part Number
5M1270ZT144C4N
Description
ALTERA
Manufacturer
Altera
Series
MAX® Vr
Datasheets

Specifications of 5M1270ZT144C4N

Programmable Type
In System Programmable
Delay Time Tpd(1) Max
6.2ns
Voltage Supply - Internal
1.71 V ~ 1.89 V
Number Of Logic Elements/blocks
1270
Number Of Macrocells
980
Number Of Gates
-
Number Of I /o
114
Operating Temperature
0°C ~ 85°C
Mounting Type
Surface Mount
Package / Case
144-LQFP
Lead Free Status / Rohs Status
Vendor undefined / RoHS Compliant

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Chapter 8: JTAG Boundary-Scan Testing in MAX V Devices
IEEE Std. 1149.1 BST Operation Control
Figure 8–8. IEEE Std. 1149.1 BST SAMPLE/PRELOAD Mode
December 2010 Altera Corporation
Figure 8–8
SAMPLE/PRELOAD instruction code shifts in through the TDI pin. The TAP controller
advances to the CAPTURE_DR state and then to the SHIFT_DR state, where it remains if
TMS is held low. The data shifted out of the TDO pin consists of the data that was
present in the capture registers after the capture phase. New test data shifted into the
TDI pin appears at the TDO pin after being clocked through the entire boundary-scan
register.
OUTJ
OUTJ
OEJ
OEJ
INJ
INJ
SHIFT
SHIFT
SDI
SDI
shows the capture, shift, and update phases of SAMPLE/PRELOAD mode.
0
1
0
1
0
1
0
1
0
1
0
1
CLOCK
CLOCK
D
D
D
D
D
D
Output
Output
Input
Input
OE
OE
Q
Q
Q
Q
Q
Q
(Shift and Update Phase)
SDO
SDO
Capture
Registers
Capture
Registers
(Capture Phase)
UPDATE
UPDATE
D
D
D
D
Output
Output
OE
OE
Q
Q
Q
Q
Update
Registers
Update
Registers
HIGHZ
HIGHZ
0
1
0
1
MODE
MODE
0
1
0
1
0
1
0
1
Global Signals
Global Signals
PIN_IN
PIN_OE
PIN_OUT
PIN_IN
PIN_OE
PIN_OUT
Output
Buffer
Output
Buffer
Pin
Pin
MAX V Device Handbook
8–9

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