ATMEGA16A-PU Atmel, ATMEGA16A-PU Datasheet - Page 229

MCU AVR 16K FLASH 16MHZ 40-PDIP

ATMEGA16A-PU

Manufacturer Part Number
ATMEGA16A-PU
Description
MCU AVR 16K FLASH 16MHZ 40-PDIP
Manufacturer
Atmel
Series
AVR® ATmegar
Datasheets

Specifications of ATMEGA16A-PU

Core Processor
AVR
Core Size
8-Bit
Speed
16MHz
Connectivity
I²C, SPI, UART/USART
Peripherals
Brown-out Detect/Reset, POR, PWM, WDT
Number Of I /o
32
Program Memory Size
16KB (8K x 16)
Program Memory Type
FLASH
Eeprom Size
512 x 8
Ram Size
1K x 8
Voltage - Supply (vcc/vdd)
2.7 V ~ 5.5 V
Data Converters
A/D 8x10b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
40-DIP (0.600", 15.24mm)
Processor Series
ATMEGA16x
Core
AVR8
Data Bus Width
8 bit
Data Ram Size
1 KB
Interface Type
2-Wire/SPI/USART
Maximum Clock Frequency
16 MHz
Number Of Programmable I/os
32
Number Of Timers
3
Maximum Operating Temperature
+ 85 C
Mounting Style
Through Hole
3rd Party Development Tools
EWAVR, EWAVR-BL
Development Tools By Supplier
ATAVRDRAGON, ATSTK500, ATSTK600, ATAVRISP2, ATAVRONEKIT
Minimum Operating Temperature
- 40 C
On-chip Adc
8-ch x 10-bit
Package
40PDIP
Device Core
AVR
Family Name
ATmega
Maximum Speed
16 MHz
Operating Supply Voltage
3.3|5 V
Controller Family/series
AVR MEGA
No. Of I/o's
32
Eeprom Memory Size
512Byte
Ram Memory Size
1KB
Cpu Speed
16MHz
Rohs Compliant
Yes
For Use With
ATSTK600 - DEV KIT FOR AVR/AVR32ATSTK500 - PROGRAMMER AVR STARTER KIT
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
23.5
23.6
8154B–AVR–07/09
Using the Boundary-scan Chain
Using the On-chip Debug System
As shown in the state diagram, the Run-Test/Idle state need not be entered between selecting
JTAG instruction and using Data Registers, and some JTAG instructions may select certain
functions to be performed in the Run-Test/Idle, making it unsuitable as an Idle state.
Note:
For detailed information on the JTAG specification, refer to the literature listed in
on page
A complete description of the Boundary-scan capabilities are given in the section
(JTAG) Boundary-scan” on page
As shown in
All read or modify/write operations needed for implementing the Debugger are done by applying
AVR instructions via the internal AVR CPU Scan Chain. The CPU sends the result to an I/O
memory mapped location which is part of the communication interface between the CPU and the
JTAG system.
The Break Point Unit implements Break on Change of Program Flow, Single Step Break, 2 Pro-
gram Memory Break Points, and 2 combined Break Points. Together, the 4 Break Points can be
configured as either:
• Apply the TMS sequence 1, 1, 0 to re-enter the Run-Test/Idle state. The instruction is latched
• At the TMS input, apply the sequence 1, 0, 0 at the rising edges of TCK to enter the Shift
• Apply the TMS sequence 1, 1, 0 to re-enter the Run-Test/Idle state. If the selected Data
• A scan chain on the interface between the internal AVR CPU and the internal peripheral units
• Break Point unit
• Communication interface between the CPU and JTAG system
• 4 single Program Memory Break Points
• 3 Single Program Memory Break Point + 1 single Data Memory Break Point
The TMS input must be held low during input of the 3 LSBs in order to remain in the Shift-IR
state. The MSB of the instruction is shifted in when this state is left by setting TMS high.
While the instruction is shifted in from the TDI pin, the captured IR-state 0x01 is shifted out on
the TDO pin. The JTAG Instruction selects a particular Data Register as path between TDI
and TDO and controls the circuitry surrounding the selected Data Register.
onto the parallel output from the Shift Register path in the Update-IR state. The Exit-IR,
Pause-IR, and Exit2-IR states are only used for navigating the state machine.
Data Register – Shift-DR state. While in this state, upload the selected Data Register
(selected by the present JTAG instruction in the JTAG Instruction Register) from the TDI input
at the rising edge of TCK. In order to remain in the Shift-DR state, the TMS input must be
held low during input of all bits except the MSB. The MSB of the data is shifted in when this
state is left by setting TMS high. While the Data Register is shifted in from the TDI pin, the
parallel inputs to the Data Register captured in the Capture-DR state is shifted out on the
TDO pin.
Register has a latched parallel-output, the latching takes place in the Update-DR state. The
Exit-DR, Pause-DR, and Exit2-DR states are only used for navigating the state machine.
Independent of the initial state of the TAP Controller, the Test-Logic-Reset state can always be
entered by holding TMS high for five TCK clock periods.
231.
Figure
23-1, the hardware support for On-chip Debugging consists mainly of:
232.
ATmega16A
“Bibliography”
“IEEE 1149.1
229

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