MC9S12E64CFU Freescale Semiconductor, MC9S12E64CFU Datasheet - Page 541

• Manufacturer Part Number: MC9S12E64CFU
• Description: IC MCU 64K FLASH 25MHZ 80-QFP
• Manufacturer: Freescale Semiconductor
• Series: HCS12r

Specifications of MC9S12E64CFU

• Core Processor: HCS12
• Core Size: 16-Bit
• Speed: 25MHz
• Connectivity: EBI/EMI, I²C, SCI, SPI
• Peripherals: POR, PWM, WDT
• Number Of I /o: 60
• Program Memory Size: 64KB (64K x 8)
• Program Memory Type: FLASH
• Ram Size: 4K x 8
• Voltage - Supply (vcc/vdd): 2.35 V ~ 2.75 V
• Data Converters: A/D 16x10b; D/A 2x8b
• Oscillator Type: Internal
• Operating Temperature: -40°C ~ 85°C
• Package / Case: 80-QFP
• Data Bus Width: 16 bit
• Data Ram Size: 4 KB
• Interface Type: SCI, SPI
• Maximum Clock Frequency: 25 MHz
• Number Of Programmable I/os: 60
• Number Of Timers: 16 bit
• Maximum Operating Temperature: + 85 C
• Mounting Style: SMD/SMT
• Minimum Operating Temperature: - 40 C
• On-chip Adc: 10 bit
• On-chip Dac: 8 bit, 2 Channel
• For Use With: M68EVB912E128 - BOARD EVAL FOR MC9S12E128/64
• Lead Free Status / RoHS Status: Contains lead / RoHS non-compliant
• Eeprom Size: -
• Lead Free Status / Rohs Status: No RoHS Version Available

control bits PIPOE, LSTRE and RDWE are reset to zero. Writing the opposite value into these bits in
single chip mode does not change the operation of the associated Port E pins.
Port E, bit 4 can be configured for a free-running E clock output by clearing NECLK=0. Typically the only
use for an E clock output while the MCU is in single chip modes would be to get a constant speed clock
for use in the external application system.
18.4.3.2.2
In expanded wide modes, Ports A and B are configured as a 16-bit multiplexed address and data bus and
Port E provides bus control and status signals. In special test mode, the write protection of many control
bits is lifted so that they can be thoroughly tested without needing to go through reset.
18.4.3.3
There is a test operating mode in which an external master, such as an I.C. tester, can control the on-chip
peripherals.
18.4.3.3.1
This mode is intended for factory testing of the MCU. In this mode, the CPU is inactive and an external
(tester) bus master drives address, data and bus control signals in through Ports A, B and E. In effect, the
whole MCU acts as if it was a peripheral under control of an external CPU. This allows faster testing of
on-chip memory and peripherals than previous testing methods. Since the mode control register is not
accessible in peripheral mode, the only way to change to another mode is to reset the MCU into a different
mode. Background debugging should not be used while the MCU is in special peripheral mode as internal
bus conflicts between BDM and the external master can cause improper operation of both functions.
18.4.4
Internal visibility is available when the MCU is operating in expanded wide modes or emulation narrow
mode. It is not available in single-chip, peripheral or normal expanded narrow modes. Internal visibility is
enabled by setting the IVIS bit in the MODE register.
If an internal access is made while E, R/W, and LSTRB are configured as bus control outputs and internal
visibility is off (IVIS=0), E will remain low for the cycle, R/W will remain high, and address, data and the
LSTRB pins will remain at their previous state.
When internal visibility is enabled (IVIS=1), certain internal cycles will be blocked from going external.
During cycles when the BDM is selected, R/W will remain high, data will maintain its previous state, and
address and LSTRB pins will be updated with the internal value. During CPU no access cycles when the
BDM is not driving, R/W will remain high, and address, data and the LSTRB pins will remain at their
previous state.
Freescale Semiconductor
Internal Visibility
Test Operating Mode
Special Test Mode
Peripheral Mode
MC9S12E128 Data Sheet, Rev. 1.07
Chapter 18 Multiplexed External Bus Interface (MEBIV3)
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