PEB 4364 T V1.2 Infineon Technologies, PEB 4364 T V1.2 Datasheet - Page 94

• Manufacturer Part Number: PEB 4364 T V1.2
• Description: IC SLIC VOICE ACCESS PDSO-36
• Manufacturer: Infineon Technologies
• Series: DuSLICr

Specifications of PEB 4364 T V1.2

• Function: Dual Channel Subscriber Line Interface Circuit (DuSLIC)
• Interface: IOM-2, PCM
• Number Of Circuits: 2
• Voltage - Supply: 3.3 V ~ 5 V
• Current - Supply: 105mA
• Operating Temperature: -40°C ~ 85°C
• Mounting Type: Surface Mount
• Package / Case: 36-PDSO
• Includes: DTMF Generator and Decoder, Line Echo Cancellation (LEC), Teletax (TTX) Generation, Universal Tone Detection (UTD)
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Power (watts): -
• Other names: PEB4364TV1.2XT; SP000007728

3.8
3.8.1
Subscriber loops are affected by a variety of failures that must be monitored. Monitoring
the loop requires access to the subscriber loop and requires test equipment in place that
is capable of performing certain specific measurements. The tests involve measurement
of resistance, capacitance, leakage, and any interfering currents and voltages.
3.8.1.1
Conventional linecards in Central Office (CO) applications usually need two test relays
per channel to access the subscriber loop with the appropriate test equipment. One relay
(test-out) connects the actual test unit to the local loop. All required line tests can be
accomplished that way. The second relay (test-in) separates the local loop from the SLIC
and connects a termination impedance to it. Hence, sending a tone signal allows the
entire loop to be checked, including the SLICOFI-2x and SLIC.
3.8.1.2
The DuSLIC chip set uses its Integrated Test and Diagnostic Functions (ITDF) to
perform all tests necessary for monitoring the local loop without an external test unit and
test relays. The fact that measurements can be accomplished much faster than with
conventional test capabilities makes an even more compelling argument for the use of
the DuSLIC chip set. With the DuSLIC, line tests on both channels can be performed
concurrently, which also has a tremendous impact on the test time. All in all, the DuSLIC
increases the quality of service and reduces the costs in various applications.
Figure 39
Preliminary Data Sheet
DuSLIC-S
DuSLIC-S2
DuSLIC-E
DuSLIC-E2
DuSLIC-P
Integrated Test and Diagnostic Functions (ITDF)
Introduction
Conventional Line Testing
DuSLIC Line Testing
Line Testing
DuSLIC Line Testing
Yes
Yes
Yes
Yes
Yes
Line failure
94
CO
Operational Description
duslic_0025_linetesting
DS3, 2003-07-11
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DuSLIC