IC ACEX 1K FPGA 10K 100-TQFP

EP1K10TC100-3

Manufacturer Part NumberEP1K10TC100-3
DescriptionIC ACEX 1K FPGA 10K 100-TQFP
ManufacturerAltera
SeriesACEX-1K®
EP1K10TC100-3 datasheet
 


Specifications of EP1K10TC100-3

Number Of Logic Elements/cells576Number Of Labs/clbs72
Total Ram Bits12288Number Of I /o66
Number Of Gates56000Voltage - Supply2.375 V ~ 2.625 V
Mounting TypeSurface MountOperating Temperature0°C ~ 70°C
Package / Case100-TQFP, 100-VQFPLead Free Status / RoHS StatusContains lead / RoHS non-compliant
Other names544-1027  
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Generic Testing
Operating
Conditions
Table 18. ACEX 1K Device Absolute Maximum Ratings
Symbol
Parameter
V
Supply voltage
CCINT
V
CCIO
V
DC input voltage
I
I
DC output current, per pin
OUT
T
Storage temperature
STG
T
Ambient temperature
AMB
T
Junction temperature
J
Altera Corporation
ACEX 1K Programmable Logic Device Family Data Sheet
Each ACEX 1K device is functionally tested. Complete testing of each
configurable static random access memory (SRAM) bit and all logic
functionality ensures 100% yield. AC test measurements for ACEX 1K
devices are made under conditions equivalent to those shown in
Figure
21. Multiple test patterns can be used to configure devices during
all stages of the production flow.
Figure 21. ACEX 1K AC Test Conditions
Power supply transients can affect AC
measurements. Simultaneous transitions of
multiple outputs should be avoided for
accurate measurement. Threshold tests
must not be performed under AC
conditions. Large-amplitude, fast-ground-
current transients normally occur as the
device outputs discharge the load
capacitances. When these transients flow
through the parasitic inductance between
the device ground pin and the test system
ground, significant reductions in
observable noise immunity can result.
Numbers in brackets are for 2.5-V devices
or outputs. Numbers without brackets are
for 3.3-V devices or outputs.
Tables 18
through
21
provide information on absolute maximum ratings,
recommended operating conditions, DC operating conditions, and
capacitance for 2.5-V ACEX 1K devices.
Conditions
With respect to ground
No bias
Under bias
PQFP, TQFP, and BGA packages, under
bias
703
[481
]
Device
Output
8.06 k
[481
]
Device input
rise and fall
times < 3 ns
Note (1)
Min
(2)
–0.5
–0.5
–2.0
–25
–65
–65
VCCIO
To Test
System
C1 (includes
JIG capacitance)
13
Max
Unit
3.6
V
4.6
V
5.75
V
25
mA
150
C
°
135
C
°
135
C
°
45