MC9S08QG4MPAE Freescale Semiconductor, MC9S08QG4MPAE Datasheet - Page 289

• Manufacturer Part Number: MC9S08QG4MPAE
• Description: IC MCU 4K FLASH 8-PDIP
• Manufacturer: Freescale Semiconductor
• Series: HCS08r

Specifications of MC9S08QG4MPAE

• Core Processor: HCS08
• Core Size: 8-Bit
• Speed: 20MHz
• Connectivity: I²C, SCI, SPI
• Peripherals: LVD, POR, PWM, WDT
• Number Of I /o: 4
• Program Memory Size: 4KB (4K x 8)
• Program Memory Type: FLASH
• Ram Size: 256 x 8
• Voltage - Supply (vcc/vdd): 1.8 V ~ 3.6 V
• Data Converters: A/D 4x10b
• Oscillator Type: Internal
• Operating Temperature: -40°C ~ 125°C
• Package / Case: 8-DIP (0.300", 7.62mm)
• Controller Family/series: HCS08
• No. Of I/o's: 6
• Ram Memory Size: 256Byte
• Cpu Speed: 20MHz
• No. Of Timers: 2
• Embedded Interface Type: I2C, SCI, SPI
• Rohs Compliant: Yes
• Processor Series: S08QG
• Core: HCS08
• Data Bus Width: 8 bit
• Data Ram Size: 256 B
• Interface Type: I2C, SCI, SPI
• Maximum Clock Frequency: 20 MHz
• Number Of Programmable I/os: 12
• Number Of Timers: 1
• Maximum Operating Temperature: + 125 C
• Mounting Style: Through Hole
• 3rd Party Development Tools: EWS08
• Development Tools By Supplier: DEMO9S08QG8E
• Minimum Operating Temperature: - 40 C
• On-chip Adc: 10 bit, 8 Channel
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Eeprom Size: -
• Lead Free Status / Rohs Status: Details

1
The susceptibility performance classification is described in
Freescale Semiconductor
Conducted susceptibility, electrical
fast transient/burst (EFT/B)
Data based on qualification test results. Not tested in production.
Result
A
B
C
D
E
Parameter
Self-recovering
Hard failure
Soft failure
No failure
Damage
failure
Table A-18. Susceptibility Performance Classification
MC9S08QG8 and MC9S08QG4 Data Sheet, Rev. 5
Table A-17. Conducted Susceptibility, EFT/B
The MCU performs as designed during and after exposure.
The MCU does not perform as designed during exposure. The MCU returns
automatically to normal operation after exposure is removed.
The MCU does not perform as designed during exposure. The MCU does not return to
normal operation until exposure is removed and the RESET pin is asserted.
The MCU does not perform as designed during exposure. The MCU does not return to
normal operation until exposure is removed and the power to the MCU is cycled.
The MCU does not perform as designed during and after exposure. The MCU cannot
be returned to proper operation due to physical damage or other permanent
performance degradation.
Symbol
V
CS_EFT
package type
Conditions
V
T
A
DD
= +25
TBD
= 3.3V
Performance Criteria
o
C
Table
TBD crystal
f
TBD bus
OSC
/f
A-18.
BUS
Result
Appendix A Electrical Characteristics
A
B
C
D
Amplitude
(Min)
TBD
TBD
TBD
TBD
1
Unit
kV
287