ST72561J9-Auto STMicroelectronics, ST72561J9-Auto Datasheet - Page 315

• Manufacturer Part Number: ST72561J9-Auto
• Description: 8-bit MCU for automotive
• Manufacturer: STMicroelectronics

Specifications of ST72561J9-Auto

• Hdflash Endurance: 100 cycles, data retention 20 years at 55 °C
• 5 Power Saving Modes: halt, auto wake up from halt, active halt, wait and slow

ST72561-Auto
24
24.1
24.1.1
24.1.2
Important notes
All devices
RESET pin protection with LVD enabled
As mentioned in note 2 below
to connect a pull-up resistor or capacitor. A 10nF pull-down capacitor is required to filter
noise on the reset line.
Clearing active interrupts outside interrupt routine
When an active interrupt request occurs at the same time as the related flag or interrupt
mask is being cleared, the CC register may be corrupted.
Concurrent interrupt context
The symptom does not occur when the interrupts are handled normally, that is, when:
●
●
●
If these conditions are not met, the symptom can be avoided by implementing the following
sequence:
Perform SIM and RIM operation before and after resetting an active interrupt request
Example 1:
Nested interrupt context
The symptom does not occur when the interrupts are handled normally, that is, when:
●
●
●
The interrupt request is cleared (flag reset or interrupt mask) within its own interrupt
routine
The interrupt request is cleared (flag reset or interrupt mask) within any interrupt
routine
The interrupt request is cleared (flag reset or interrupt mask) in any part of the code
while this interrupt is disabled
SIM
reset flag or interrupt mask
RIM
The interrupt request is cleared (flag reset or interrupt mask) within its own interrupt
routine
The interrupt request is cleared (flag reset or interrupt mask) within any interrupt
routine with higher or identical priority level
The interrupt request is cleared (flag reset or interrupt mask) in any part of the code
while this interrupt is disabled
Figure
Doc ID 12370 Rev 8
135, when the LVD is enabled, it is recommended not
Important notes
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