AT32UC3C2256C Atmel Corporation, AT32UC3C2256C Datasheet - Page 1215

• Manufacturer Part Number: AT32UC3C2256C
• Manufacturer: Atmel Corporation

Specifications of AT32UC3C2256C

• Flash (kbytes): 256 Kbytes
• Pin Count: 64
• Max. Operating Frequency: 66 MHz
• Cpu: 32-bit AVR
• Hardware Qtouch Acquisition: No
• Max I/o Pins: 45
• Ext Interrupts: 64
• Usb Transceiver: 1
• Quadrature Decoder Channels: 1
• Usb Speed: Full Speed
• Usb Interface: Device + OTG
• Spi: 5
• Twi (i2c): 2
• Uart: 4
• Can: 2
• Lin: 4
• Ssc: 1
• Ethernet: 1
• Graphic Lcd: No
• Video Decoder: No
• Camera Interface: No
• Adc Channels: 11
• Adc Resolution (bits): 12
• Adc Speed (ksps): 2000
• Analog Comparators: 2
• Resistive Touch Screen: No
• Dac Channels: 2
• Dac Resolution (bits): 12
• Temp. Sensor: No
• Crypto Engine: No
• Sram (kbytes): 68
• Self Program Memory: YES
• Dram Memory: No
• Nand Interface: No
• Picopower: No
• Temp. Range (deg C): -40 to 85
• I/o Supply Class: 3.0 to 3.6 or 4.5 to 5.5
• Operating Voltage (vcc): 3.0 to 3.6 or 4.5 to 5.5
• Fpu: Yes
• Mpu / Mmu: Yes / No
• Timers: 3
• Output Compare Channels: 13
• Input Capture Channels: 6
• Pwm Channels: 14
• 32khz Rtc: Yes
• Calibrated Rc Oscillator: Yes

39.5.2.3
32117C–AVR-08/11
EXTEST
Table 39-11. SAMPLE_PRELOAD Details
This instruction selects the boundary-scan chain as Data Register for testing circuitry external to
the 32-bit AVR package. The contents of the latched outputs of the boundary-scan chain is
driven out as soon as the JTAG IR-register is loaded with the EXTEST instruction.
Starting in Run-Test/Idle, the EXTEST instruction is accessed the following way:
Table 39-12. EXTEST Details
Instructions
IR input value
IR output value
DR Size
DR input value
DR output value
Instructions
IR input value
IR output value
DR Size
DR input value
DR output value
1. Select the IR Scan path.
2. In Capture-IR: The IR output value is latched into the shift register.
3. In Shift-IR: The instruction register is shifted by the TCK input.
4. Return to Run-Test/Idle.
5. Select the DR Scan path.
6. In Capture-DR: The Data on the external pins are sampled into the boundary-scan
7. In Shift-DR: The boundary-scan chain is shifted by the TCK input.
8. Return to Run-Test/Idle.
1. Select the IR Scan path.
2. In Capture-IR: The IR output value is latched into the shift register.
3. In Shift-IR: The instruction register is shifted by the TCK input.
4. In Update-IR: The data from the boundary-scan chain is applied to the output pins.
5. Return to Run-Test/Idle.
6. Select the DR Scan path.
7. In Capture-DR: The data on the external pins is sampled into the boundary-scan chain.
8. In Shift-DR: The boundary-scan chain is shifted by the TCK input.
9. In Update-DR: The data from the scan chain is applied to the output pins.
10. Return to Run-Test/Idle.
chain.
Details
00010 (0x02)
p0001
Depending on boundary-scan chain, see BSDL-file.
Depending on boundary-scan chain, see BSDL-file.
Depending on boundary-scan chain, see BSDL-file.
Details
00011 (0x03)
p0001
Depending on boundary-scan chain, see BSDL-file.
Depending on boundary-scan chain, see BSDL-file.
Depending on boundary-scan chain, see BSDL-file.
AT32UC3C
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