MCF5307AI90B Freescale Semiconductor, MCF5307AI90B Datasheet - Page 426

• Manufacturer Part Number: MCF5307AI90B
• Description: IC MPU 32BIT COLDF 90MHZ 208FQFP
• Manufacturer: Freescale Semiconductor
• Series: MCF530xr

Specifications of MCF5307AI90B

• Core Processor: Coldfire V3
• Core Size: 32-Bit
• Speed: 90MHz
• Connectivity: EBI/EMI, I²C, UART/USART
• Peripherals: DMA, POR, WDT
• Number Of I /o: 16
• Program Memory Type: ROMless
• Ram Size: 4K x 8
• Voltage - Supply (vcc/vdd): 3 V ~ 3.6 V
• Oscillator Type: External
• Operating Temperature: 0°C ~ 70°C
• Package / Case: 208-FQFP
• Maximum Clock Frequency: 90 MHz
• Maximum Operating Temperature: + 105 C
• Mounting Style: SMD/SMT
• Minimum Operating Temperature: 0 C
• Family Name: MCF5xxx
• Device Core: ColdFire
• Device Core Size: 32b
• Frequency (max): 90MHz
• Instruction Set Architecture: RISC
• Supply Voltage 1 (typ): 3.3V
• Operating Temp Range: 0C to 70C
• Operating Temperature Classification: Commercial
• Mounting: Surface Mount
• Pin Count: 208
• Package Type: FQFP
• Program Memory Size: 8KB
• Cpu Speed: 90MHz
• Embedded Interface Type: I2C, UART
• Digital Ic Case Style: FQFP
• No. Of Pins: 208
• Supply Voltage Range: 3V To 3.6V
• Rohs Compliant: Yes
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Eeprom Size: -
• Program Memory Size: -
• Data Converters: -
• Lead Free Status / Rohs Status: Lead free / RoHS Compliant

JTAG Signal Descriptions
Figure 19-1 is a block diagram of the MCF5307 implementation of the 1149.1 IEEE
standard. The test logic includes several test data registers, an instruction register,
instruction register control decode, and a 16-state dedicated TAP controller.
19.2 JTAG Signal Descriptions
JTAG operation on the MCF5307 is enabled when MTMOD0 is high (logic 1), as described
in Table 19-1. Otherwise, JTAG TAP signals, TCK, TMS, TDI, TDO, and TRST, are
interpreted as the debug port pins. MTMOD0 should not be changed while RSTI is
asserted.
19-2
BKPT
TMS/
TCK
Pin
TRST
TMS
TCK
Test clock. The dedicated JTAG test logic clock is independent of the MCF5307 processor clock. Various
JTAG operations occur on the rising or falling edge of TCK. Internal JTAG controller logic is designed such
that holding TCK high or low indefinitely does cause the JTAG test logic to lose state information. If TCK is
not used, it should be tied to ground.
Test mode select (MTMOD0 high)/breakpoint (MTMOD0 low). TMS provides the JTAG controller with
information to determine the test operation mode. The states of TMS and of the internal 16-state JTAG
controller state machine at the rising edge of TCK determine whether the JTAG controller holds its current
state or advances to the next state. This directly controls whether JTAG data or instruction operations
occur. TMS has an internal pull-up, so if it is not driven low, its value defaults to a logic level of 1. If TMS is
not used, it should be tied to VDD. BKPT signals a hardware breakpoint to the processor in debug mode.
See Chapter 5, “Debug Support.”
TDI
V+
V+
V+
Figure 19-1. JTAG Test Logic Block Diagram
Freescale Semiconductor, Inc.
For More Information On This Product,
Table 19-1. JTAG Pin Descriptions
Bypass
3-Bit Instruction Register
Boundary Scan Register
3-Bit Instruction Decode
Test Data Registers
ID Code
Go to: www.freescale.com
MCF5307 User’s Manual
TAP
Description
M
U
X
M
U
X
TDO