SAM3S1B Atmel Corporation, SAM3S1B Datasheet - Page 216

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SAM3S1B

Manufacturer Part Number
SAM3S1B
Description
Manufacturer
Atmel Corporation
Datasheets

Specifications of SAM3S1B

Flash (kbytes)
64 Kbytes
Pin Count
64
Max. Operating Frequency
64 MHz
Cpu
Cortex-M3
# Of Touch Channels
23
Hardware Qtouch Acquisition
No
Max I/o Pins
34
Ext Interrupts
34
Usb Transceiver
1
Quadrature Decoder Channels
1
Usb Speed
Full Speed
Usb Interface
Device
Spi
3
Twi (i2c)
2
Uart
4
Ssc
1
Sd / Emmc
1
Graphic Lcd
No
Video Decoder
No
Camera Interface
No
Adc Channels
10
Adc Resolution (bits)
12
Adc Speed (ksps)
1000
Analog Comparators
1
Resistive Touch Screen
No
Dac Channels
2
Dac Resolution (bits)
12
Temp. Sensor
Yes
Crypto Engine
No
Sram (kbytes)
16
Self Program Memory
YES
Dram Memory
No
Nand Interface
Yes
Picopower
No
Temp. Range (deg C)
-40 to 85
I/o Supply Class
1.8/3.3
Operating Voltage (vcc)
1.62 to 3.6
Fpu
No
Mpu / Mmu
Yes / No
Timers
3
Output Compare Channels
3
Input Capture Channels
3
Pwm Channels
4
32khz Rtc
Yes
Calibrated Rc Oscillator
Yes
11.3
11.3.1
11.3.2
216
Application Examples
SAM3S
Debug Environment
Test Environment
Figure 11-2
standard debugging functions, such as downloading code and single-stepping through the pro-
gram and viewing core and peripheral registers.
Figure 11-2. Application Debug Environment Example
Figure 11-3
and interpreted by the tester. In this example, the “board in test” is designed using a number of
JTAG-compliant devices. These devices can be connected to form a single scan chain.
shows a complete debug environment example. The SWJ-DP interface is used for
shows a test environment example (JTAG Boundary scan). Test vectors are sent
SAM3-based Application Board
Emulator/Probe
Connector
SWJ-DP
SWJ-DP
SAM3
Host Debugger
PC
6500C–ATARM–8-Feb-11

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