MCF5407CAI220 Freescale Semiconductor, MCF5407CAI220 Datasheet - Page 474
![IC MPU 32B 220MHZ COLDF 208-FQFP](/photos/12/22/122277/mcf5407cai220_sml.jpg)
MCF5407CAI220
Manufacturer Part Number
MCF5407CAI220
Description
IC MPU 32B 220MHZ COLDF 208-FQFP
Manufacturer
Freescale Semiconductor
Series
MCF540xr
Specifications of MCF5407CAI220
Core Processor
Coldfire V4
Core Size
32-Bit
Speed
220MHz
Connectivity
EBI/EMI, I²C, UART/USART
Peripherals
DMA, WDT
Number Of I /o
16
Program Memory Type
ROMless
Ram Size
4K x 8
Voltage - Supply (vcc/vdd)
1.65 V ~ 3.6 V
Oscillator Type
External
Operating Temperature
-40°C ~ 85°C
Package / Case
208-FQFP
Processor Series
MCF540x
Core
ColdFire V4
Data Bus Width
32 bit
Program Memory Size
8 KB
Data Ram Size
4 KB
Maximum Clock Frequency
162 MHz
Number Of Programmable I/os
16
Operating Supply Voltage
1.8 V to 3.3 V
Mounting Style
SMD/SMT
3rd Party Development Tools
JLINK-CF-BDM26, EWCF
Cpu Speed
220MHz
Embedded Interface Type
I2C, UART
Digital Ic Case Style
FQFP
No. Of Pins
208
Supply Voltage Range
3.3V
Rohs Compliant
Yes
For Use With
M5407C3 - KIT EVAL FOR MCF5407 W/ETHERNET
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
Program Memory Size
-
Data Converters
-
Lead Free Status / Rohs Status
Lead free / RoHS Compliant
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
MCF5407CAI220
Manufacturer:
Freescale
Quantity:
789
Company:
Part Number:
MCF5407CAI220
Manufacturer:
Freescale Semiconductor
Quantity:
10 000
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Restrictions
19.4.4 JTAG Bypass Register
The IEEE Standard 1149.1-compliant bypass register creates a single-bit shift register path
from TDI to the bypass register to TDO when the BYPASS instruction is selected.
19.5 Restrictions
Test logic design is static, so TCK can be stopped in high or low state with no data loss.
However, system logic uses a different system clock not internally synchronized to TCK.
Operation mixing 1149.1 test logic with system functional logic that uses both clocks must
coordinate and synchronize these clocks externally to the MCF5407.
19.6 Disabling IEEE Standard 1149.1 Operation
There are two ways to use the MCF5407 without IEEE Standard 1149.1 test logic being
active:
19-10
101
102
103
104
105
106
107
108
109
110
111
112
113
114
115
116
117
118
119
Bit
Cell Type
O.Pin
O.Pin
O.Pin
O.Pin
O.Pin
O.Pin
O.Pin
O.Pin
O.Pin
O.Pin
O.Pin
I.Pin
I.Pin
I.Pin
I.Pin
I.Pin
I.Pin
I.Pin
I.Pin
D26
D26
D27
D27
D28
D28
D29
D29
D30
D30
D31
D31
SDA
SDA
SCL
SCL
BE3
BE2
BE1
Pin Cell
Table 19-4. Boundary-Scan Bit Definitions
Pin Type
MCF5407 User’s Manual
OD
OD
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
O
O
O
I
I
221
222
223
224
225
226
227
228
229
230
231
232
233
234
235
236
237
238
Bit
Cell Type
O.Pin
O.Pin
O.Pin
O.Pin
O.Pin
O.Pin
O.Pin
O.Pin
O.Pin
I.Pin
I.Pin
I.Pin
I.Pin
I.Pin
I.Pin
I.Pin
I.Pin
I.Pin
A8
A8
A7
A7
A6
A6
A5
A5
A4
A4
A3
A3
A2
A2
A1
A1
A0
A0
Pin Cell
Pin Type
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
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